X-ray Laue Diffraction Microscopy in 3D at 34-ID-E, APS - Research Highlights

Beamline Phone Number: (630) 252-1834

The APS Science & Research Highlights

Squeezing Information from Materials under Extreme Pressure (also see Highlight at Physorg.com) Getting to the Roots of Lethal Hairs (also see Physics Update at Physics Today) Uncovering Secrets of the Strength of Materials Materials Analysis Using New X-ray Microbeams

Selected Publications

Beamline Presentations

Three Dimensional Deformation Microstructure Measurement Under Indents Using Submicron Resolution X-Ray Structural Microscopy (APS User Meeting 2005) W. Yang, B. C. Larson, G. M. Pharr, J. Z. Tischler, G. E. Ice, J. D. Budai, and W. Liu Nondispersive Hard X-ray K-B Focusing Below 100 nm (APS User Meeting 2005) Wenjun Liu, Gene E. Ice, Jonathan Z. Tischler, B. C. Larson, P. Zschack, A. Khounsary, C. Liu, L. Assoufid, R. Divan, and A. Macrander Development of Submicron Resolution 2D and 3D X-Ray Structural Microscopy (APS User Meeting 2004) B. C. Larson, W. Yang, J. D. Budai, J. Z. Tischler, G. E. Ice, and W. Liu 3D X-ray Diffraction Microscopy of Grain Boundaries (APS User Meeting 2003) Wenjun Liu, Gene E. Ice, Wenge Yang, Jon Z. Tischler, and Bennett C. Larson

 

04.27.2018