The PicoProbe is an advanced next generation analytical electron microscope which is the results of a multi-year CRADA (#1300701) at Argonne. This monochromated, aberration corrected, probe forming analytical electron microscope will harken the next generation of complementary characterization resource. It facilitates state-of-the-art correlative studies of the morphology, crystallography, elemental, chemical and electronic structure composition of soft and hard matter in static environments. Having the ability to operate between 30 and 300 keV, has probe sizes as small as 50 picometers. Combined with the worlds highest sensitivity Pi+ sR detector for x-ray spectroscopy and the ZTwin lens, designed by Argonne, the Picoprobe enables unprecedented sensitivity and resolution for the characterization of hard and soft matter.