The Advanced Photon Source
a U.S. Department of Energy Office of Science User Facility

Sample Environments and Infrastructure (SEI), under construction

The sample environments and their infrastructures are mostly dedicated to individual beamlines at the APS.  An overview of solutions for various in situ and operando applications is given here and will be continuously expanded.

  • Sample Environments
  • Sample Infrastructures
  • Meetings - Every 4th Thursday of the month in Building 401/Room A1100, sample environments and their infrastructures are discussed addressing specific topics. Contributions in the form of 1-10 slides are welcome. The slides will be added to the collection.
  • Mailing List - Subscribe to the mailing list to receive the latest information, find competent contacts, and participate in discussions. If you want to send an email, the address is: sei-forum@lists.anl.gov
  • FAQ - Frequently asked questions will be collected for fast access to potential solution

For general information or suggestions, please contact Uta Ruett under uruett@anl.gov.

You can also get in touch with:

Ivan Kuzmenko (kuzmenko@anl.gov)   Uta Ruett (uruett@anl.gov)   Phil Ryan (pryan@anl.gov)

Ivan is a beamline scientist at 9-ID (Chemical Materials Science group) working on in situ and operando small and wide angle scattering (USAXS/SAXS/WAXS). He is especially experienced with high-temperature gas flow experiments and well as high-pressure experiments. He also has experience in conducting electrochemical measurements at high temperature and liquid-flow cells.

Ivan Kuzmenko

Uta is the leader of the Structural Science group (sectors 11 and 17-BM) dedicated to high-energy X-ray diffraction. She has experience with a variety of in situ and operando sample environments.

Uta Ruett

 

Phil is a beamline scientist at 6-ID-B (Magnetic Materials group) working on resonant scattering experiments. He has broad experience with low temperature sample environments for single crystals including electric and magnetic fields with concurrent resistivity measurements. Currently developing cyclical slow dynamic metrology capabilities (1Hz-1MHz) and uniaxial strain control both for single crystals at low temperatures.

Phil Ryan

 ​

 

 

09.23.2019