SXSPM

Synchrotron X-ray Scanning Probe Microscopy

Synchrotron X-ray Scanning Probe Microscopy is superordinate to all new emerging microscopy techniques that combine synchrotron radiation with any scanning probe variant. It can provide chemical information with extremely high spatial resolution. Magnetic contrast is obtained by utilizing polarized x-rays.

SX-STM

Synchrotron X-ray Scanning Tunneling Microscopy

Synchrotron X-ray Scanning Tunneling Microscopy is a technique that combines scanning tunneling microscopy with synchrotron radiation. It provides electronic, chemical, and magnetic contrast due to x-ray enhanced contributions to the tunneling current.

SX-AFM

Synchrotron X-ray Atomic Force Microscopy

Synchrotron X-ray Atomic Force Microscopy combines atomic force microscopy and synchrotron radiation. Chemical sensitivity is obtained because the number of photoejected electrons is directly correlated to the presence of core levels in the sample.

Topography Filter (U.S. Patent 8,850,611)

This electronic filter allows to separate topographic and chemical/magnetic information that are otherwise convoluted in the current measured in SX-STM.