The international Conference on X-ray microscopy (XRM) started in Göttingen in 1983. It has been held every third year from 1987, then every second year after 2008, considering its significance and broad interest to X-ray imaging and technique.
The XRM 2012 was held from 5 to 10 August 2012 in Shanghai. The event was organized by the Shanghai Synchrotron Radiation Facility (SSRF) and the National Synchrotron Radiation Laboratory (NSRL). It provided up-to-date information on the theoretical approaches and experimental developments in high resolution X-ray imaging and all techniques devoted to the observation of microstructures using X-rays as a probe.Our work on combining scanning tunneling microscopy and synchrotron radiation at the APS was presented by Volker Rose.