Small-Angle X-ray Scattering (SAXS) is a nondestructive method used to characterize structures of solid and fluid constituents in the nanometer (nm) range. The technique utilizes the very low angle elastic scattering of x-rays to probe the inhomogeneities of the electron density on the scale of normally 1 – 100nm, giving structural information of the samples being evaluated. By recording the very small angles of scattering one can extract information regarding the shape and size of the molecular structure of the material being investigated.

Wide-Angle X-ray Scattering (WAXS) allows to go further down the scale to sub-nanometer-sized structures due to the increase in angle between the sample and the detector during measurement. This allows for studies on crystallinity of samples and to determine the chemical/phase composition of thin films, crystallite size, as well as possible film stresses.

The USAXS facility offers world-unique capabilities to users in physics, chemistry, materials science, polymers, food science, biology, and many others. Data are measured over about: 5 decades in sizes - from approximately 6 microns to less than 1 Angstrom Intensity range of up to 12 decades About 3 minutes data collection time. This is achieved by combination of Bonse-Hart USAXS device, combined with 500mm long pinhole SAXS and 300mm long area detector based diffraction (WAXS) device.

Ptychography is a nondestructive scanning coherent diffractive imaging method which visualizes the electron density with a resolution better than 50 nm. Real space imaging of electron density can complement scattering data by providing direct images of heterogeneous samples. A 10x10 um image requires a few minutes data collection time. 3d tomography is also supported, requiring a few hours of data collection.