Advanced Photon Source

An Office of Science National User Facility

Sector 33: 33-ID-D,E


The facility provides advanced x-ray scattering and diffraction techniques to a diverse scientific community and supports advanced materials research as well as condensed matter physics. Primary usage encompasses surface and interface science, diffuse x-ray scattering, and general scattering and diffraction applications. X-ray reflection interface microscopy (XRIM) is now open to general users.

Beamline contacts
Name Email Telephone
Zhan Zhang 630.252.0863
Hawoong Hong 630.252.0864
Jon Tischler (630) 252-0861