Abstract:
Over a hundred years have passed since Arthur Compton discovered the inelastic scattering effect that now bears his name. While Compton scattering is often considered an unwanted background in X-ray diffraction and scattering experiments, it is important to recognize that the analysis of Compton line shapes offers opportunities in x-ray science, since it allows access to study the ground-state momentum density of electrons. Historically, the popularity of Compton spectroscopy for probing electron momentum densities has experienced waves that are in phase with advances in experimental techniques. This talk will highlight the relevance and potential of Compton scattering spectroscopy and discuss its fundamental principles and demonstrate its applications both in fundamental physics and in applied materials science. It will also illustrate how Compton scattering relates to X-ray Raman scattering (XRS), also known as non-resonant inelastic X-ray scattering (NIXS; but not to be confused with nuclear inelastic X-ray scattering). Finally, it will show how the use of focusing crystal optics for analyzing the spectrum of scattered X-rays enables the addition of real-space imaging into the analytical toolbox of Compton and X-ray Raman spectroscopy.
Location: (hybrid)
401/A1100; Teams
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