SPEAKER: Philippe Fontaine (SIRIUS Beamline, Synchrotron Soleil, Saint Aubin, France)
TITLE: Contribution of In-situ X-ray Measurements to the Study of Soft Interfaces
ABSTRACT: X-ray techniques are an essential tool to study soft matter interfaces. In this presentation, I will demonstrate this with two thematic that we are developing in our group.
In-situ GISAXS at the air/water interface had revealed the nano-structuration of Langmuir monolayers of semi-fluorinated alkanes (CnF2n+1CmH2m+1). On high-resolution AFM images and confirmed by in situ GISAXS and GIXD, the domains shape appears complex with a truncated conic shape surrounded by lying molecules This peculiar self-assembling behaviour was reproduced by Molecular Dynamics simulation showing how the molecule distribute in a single domain. Recently by time resolved GISAXS, we were able to measure the nano-structure formation during the deposition of the molecules.
X-rays are used to determine the structure and the composition materials, but also can be used to form new materials through the x-ray radiolysis technique. We applied this strategy to form metallic nano-particles or layers in solution and at liquid-air interface using different organic moulds using soluble or insoluble surfactants, diblock copolymers or ionic liquids.
To this aim, we develop on the French synchrotron source SOLEIL a dedicated beamlines SIRIUS that implement most of x-ray techniques that can be applied to surface and interfaces (soft or hard) either scattering techniques (GISAXS, GIWAXS, GIXD…) or spectroscopic (X-ray fluorescence, absorption spectroscopy, DAFS) with adapted sample environments (Langmuir trough, SFA-X, …).
LINK: https://uchicago.zoom.us/j/99413125459?pwd=Y1VVV2NFdE9BM1Z4dEUrbjUzUnNmdz09
Meeting ID: 994 1312 5459
Password: 972339
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