Sydor Technologies: Complex Measurements – Critical Results

Type Of Event
Presentation
Sponsoring Division
XSD
Location
431/C010
Building Number
431
Room Number
C010
Speaker
Chuck McFee and Igor Pastirk, Sydor Technologies
Host
Antonino Miceli
Start Date
02-06-2017
Start Time
11:00 a.m.
Description

Abstract:

The presentation will give an insight in the core technologies and expertise and show examples of critical problem solving though partnering and tech transfer. The talk will cover the following topics and solutions:

  • Ultrafast detection and imaging. Streak cameras will be presented with emphasis on new developments and technologies incorporated the latest generation. A quasi 2D streak camera, the new ‘psGOI’ picosecond Gated Optical Imager will also be presented. This product offers great flexibility and capability to capture events as short as 80 ps. Continuing on the topic of ultrafast temporal measurements, we will also include details on the new pulse dilation PMT (quasi single channel streak camera).
  • Sydor direct X-ray detectors. Our growing portfolio of direct detectors covering soft to hard X-ray spectrum will be showcased. This product line ranges from diamond beam positioning monitors to X-ray microstrip detectors. New developments regarding development and commercialization of KeckPAD, mixed mode PAD and fast X-ray CCD camera will be discussed.
  • Fast, scientific performance imaging accessories – MCP, PMTs, VID, ICCD. Besides standard products, the presentation will showcase the customization range and capabilities of the top-shelve detectors. New developments from our partner Photek that include multi anode PMT and TORCH square PMT development alongside space qualified programs will be included.
  • Fast HV electronics (Kentech) to enable imaging, specialized pulsers, lasers, arbitrary waveform generators and other specialty solutions.

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