13-BM-C: Sector 13 - Bending Magnet Side Station

GSECARS
Environmental Science, GeoScience

Bending magnet beamline specialized for earth and environmental science research.

Beamline Specifications
Source : Bending Magnet
Monochromator Type : Si 311
Energy Range : 28.6-28.6 keV
Resolution : 5 x 10-5
Flux : 8 x 1011 @28.6 keV
Beam Size Hxv :
Focused : 15µm x 15µm
Unfocused : 10mm x 3mm

Source : Bending Magnet
Unfocused : 10mm x 3mm
Monochromator Type : Si 111
Energy Range : 15-15 keV
Resolution : 5 x 10-5
Flux : 1 x 1012 @15 keV
Beam Size Hxv :
Focused : 350µm x 30µm

Quick Stats
Current Status
Operational/Accepting General Users
Access Mode
On-site
Special Capabilities
The monochomator is 2 crystals, providing a choice of 2 fixed energies. Vertical focusing is with a 1 meter long mirror. Horizontal focusing is by bending the monochromator crystal for larger spots, or with a horizontally focusing mirror close to the sample for small spots.
Beamline Contacts
PETER J ENG
(Surface diffraction)
Email
JOANNE E STUBBS
(Surface diffraction)
Email
DONGZHOU ZHANG
(Diamond anvil cell )
Email
VITALI B PRAKAPENKA
(Diamond anvil cell )
Email
NANCY J LAZARZ
(Administrator )
Email
STELLA CHARITON
(Diamond anvil cell )
Email
Beamline Techniques
Surface diffraction
High-pressure diamond anvil cell
Single-crystal diffraction
Endstations
13-BM-C
Surface diffraction
13-BM-C
Single-crystal diffraction in the diamond anvil cell.
13-BM-C
3 monochromator crystals providing 3 fixed energies
13-BM-C
6-circle Newport diffratometer for surface studies
Detectors
Pilatus3S 1M Si, 1mm thick
Pilatus 100K
Vortex single element and 4-element detectors (2)
Equipment
Large Newport 6-circle kappa diffractometer.
Princeton Instruments SP2360 spectrograph with PIXIS CCD
GE membrane pressure controller for diamond anvil cell
Laser Quantum GEM1000 532 nm 1W DPSS laser
IPG YLR-200 1064 nm 200 W fiber laser
Navitar 12X zoom optical microscope
Additional Information
Software
EPICS for instrument and detector control. SPEC for surface diffraction. IDL software for single-crystal diffraction.
Beamline Controls and Data Acquisition
EPICS for instrument and detector control. SPEC for surface diffraction. IDL software for single-crystal diffraction.