5-ID-B,C,D: Sector 5 - Insertion Device
Chemistry, Life Sciences, Materials Science, Polymer Science
The 5-ID beamline contains three end stations for use by general users.
The 5-ID-B station contains a custom 11-detector powder camera. This system has 11 Si(111) analyzer crystals and operates at an energy of ~ 17.5 keV for high-resolution powder diffraction measurements. The system has a six-position sample changer for capillaries. WAXS measurements with a MAR165 detector can also be performed.
The 5-ID-C station has two instruments, a kappa diffractometer for in-air or small sample environment cells, and a UHV chamber with MBE, photoelectron detection up to 10000 eV, and other capabilities. This station has post-monochromator optics for beam conditioning primarily for x-ray standing wave measurements. The UHV system and the post-monochromator optics are only available to general users in a collaborative mode.
The 5-ID-D station contains a pinhole small-angle x-ray scattering (SAXS) camera with a maximum sample-to-detector distance of approximately 7.5 m. Simultaneous small-, medium- and wide-angle diffraction (SAXS/MAXS/WAXS) with custom Rayonix fast frame-transfer CCD detectors is available on 5-ID-D, including an optional in-vacuum flow cell for solution SAXS/MAXS/WAXS.
Monochromator Type : Si(111)
Energy Range : 6-35 keV
Resolution : 1 x 10-4
Flux : 1 x 1013 @12 keV
Beam Size Hxv :
Focused : 50µm x 1000µm
Unfocused : 1mm x 1mm
Operational/Accepting General Users
On-site Mail-in
monochromatic station
x-ray scattering
powder diffraction
monochromatic station
small-angle x-ray scattering
wide-angle x-ray scattering
simultaneous SAXS/MAXS/WAXS
x-ray standing waves (collaboration only)
x-ray surface science (collaboration only)
x-ray refelectivity (collaboration only)
https://www.dnd.aps.anl.gov/
EPICS for motors and actuators on all systems. SPEC used to control diffractometers. Vendor-supplied software used to control CCD detectors. Real-time data reduction for SAXS/MAXS/WAXS system.
EPICS for motors and actuators on all systems. SPEC used to control diffractometers. Vendor-supplied software used to control CCD detectors. Real-time data reduction for SAXS/MAXS/WAXS system.
