5-BM-B: Sector 5 - Bending Magnet B Beamline

DND-CAT
Catalysis, Chemistry, Environmental Science, Materials Science, Polymer Science

The 5-BM-B beamline contains a dedicated extended x-ray absorption fine structure (EXAFS) setup, as well as a four-circle diffractometer. The front of the enclosure is available for custom experimental setups, such as 2D diffraction with our detectors. This beamline is particularly well suited for in situ diffraction studies using high-energy x-rays. The high energies available can be used to probe the interiors of macroscopic samples. White beam and focused or unfocused pink beam are also available.

Beamline Specifications
Source : Bending Magnet
Monochromator Type : Si(111)
Energy Range : 4.5-25 keV
Resolution : 1 x 10-4
Flux : 1 x 1011 @20 keV
Beam Size Hxv :
Focused : 15000µm x 500µm
Unfocused : 15mm x 5mm

Source : Bending Magnet
Focused : 15000µm x 500µm
Monochromator Type : Si(111)
Energy Range : 4.5-80 keV
Resolution : 1 x 10-4
Flux : 1 x 1011 @20 keV
Beam Size Hxv :
Unfocused : 15mm x 5mm

Quick Stats
Current Status
Operational/Accepting General Users
Access Mode
On-site Mail-in
Beamline Contacts
DENIS T KEANE
Email
MONICA A CHIUSO
Email
Beamline Techniques
X-ray absorption fine structure
High-energy x-ray diffraction
General diffraction
X-ray absorption near-edge structure
Endstations
5-BM-B
monochromatic and white beam station
5-BM-B
general purpose station for EXAFS
5-BM-B
x-ray scattering
Detectors
Spectroscopy-grade ionization chambers
Lytle detector
Scintillation detectors
Canberra PIPS 80x30 mm2 area detector
Vortex ME4 Silicon Drift Detectors
Mar 165 mm CCD detector
Bent Laue analyzers
Lytle Electron Yield Accessory
Equipment
4-circle diffractometer
Capillary lens
Outside air chemical exhaust
Displex cryostat (15K to 600K)
Gas manifold for filling detectors
Additional Information
Additional Information
https://www.dnd.aps.anl.gov/
Software
EPICS for motors and actuators on all systems. SPEC used to control diffractometers and surface science instruments Vendor-supplied software used to control CCD detectors.
Beamline Controls and Data Acquisition
EPICS for motors and actuators on all systems. SPEC used to control diffractometers and surface science instruments Vendor-supplied software used to control CCD detectors.