34-ID-E: Microdiffraction

XSD
Chemistry, Environmental Science, GeoScience, Materials Science, Physics

The facility provides microbeam diffraction techniques to a diverse scientific community. The experiments exploit the APS source brilliance to study fundamental materials structures and deformation processes using dedicated 3D x-ray microbeam diffraction microscopy.

Beamline Specifications
Source : 3.3 Undulator (Undulator A)
Monochromator Type : Pink Beam
Energy Range : 5.5-30 keV
Flux : 1 x 1014 @ keV
Beam Size Hxv :
Focused : .15µm x .15µm
Resolution :
Source : 3.3 Undulator (Undulator A)
Monochromator Type : Si(111)
Energy Range : 5.5-30 keV
Resolution : 1 x 10-4
Flux : 1 x 1011 @15 keV
Beam Size Hxv :
Focused : .15µm x .15µm
Quick Stats
Current Status
Construction
Access Mode
On-site
Beamline Contacts
WENJUN LIU
Email
 630.252.0890
DINA SHEYFER
Email
 630.252.
JONATHAN TISCHLER
Email
 630.252.0861
Beamline Techniques
Microdiffraction
Laue crystallography
Microbeam
Microfluorescence
Endstations
Detectors
Amorphous Si area detector (Perkin-Elmer) (2k x 2k)
2 Amorphous Si area detectors (Perkin-Elmer) (1k x 1k)
Vortex Si drift detector
Ionization chambers
Mar 165 for forward scattering
Equipment
Q-distributions with micro beams
3D k-space mapping with micro beams
Additional Information
Additional Information
https://www.aps.anl.gov/Sectors-33-34/34-ID-E
Software
UNIX/Linux running EPICS with VME. Custom data collection and analysis software for 3D diffraction microscopy
Beamline Controls and Data Acquisition
UNIX/Linux running EPICS with VME. Custom data collection and analysis software for 3D diffraction microscopy