Abstract: 
With the advent of brighter light sources there are new challenges in data collection. Naively increasing exposure time can easily destroy both the sample and detector, resulting in useless measurements and expensive instrument damage. In the case of disordered materials, where material defects are the information of interest, beam damage (which creates new defects) must be avoided during measurement. Here we present compressed sensing-based measurement strategies, which take advantage of the structured nature of data in order to provide measurements with minimal beam exposure. By leveraging modern signal processing and computing resources, these strategies not only reduce necessary collection time, but also provide less noisy measurements than conventional measurement strategies. 

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