Experimental Physics and Industrial Control System
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At LANSCE, we have ramp record that switches between passive (output
at setpoint, processes due to a forward link from an ai record) and
0.2 sec (when adjusting the output, for better response).
On Thu, 2007-07-12 at 16:05 +0200, Heinrich du Toit wrote:
Can I change the SCAN field at runtime?
E.g. inside my own custom record.
Some devices normally needs only be scanned say once a sec or every 5
secs. But then when you change the value you want the scanned faster at
say 0.2 secs.
- References:
- Scan question Heinrich du Toit
- Re: Scan question Emmanuel Mayssat
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ASLO / AOFF scaling for ai and ao record Stefan Heim
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ANJ, 10 Nov 2011 |
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