Experimental Physics and
Industrial Control System

Marty Kraimer <[email protected]> · Thu, 09 Dec 1999 08:09:26 -0600

Lifang Zheng wrote:
> 
> Hi all,
> 
> My DAQ is with an IP-16ADC inserted in MV162, a signal generator sends
> an input to ADC with another generator creating trigger signals.
> 
>  My aim is: When the external trigger signal arrives to make ADC
> conversion, after  an interrupt creats, the new conversion data can be
> displayed in MEDM. I don't know if it's possible  with "I/O Intr" scan
> in DB and asynchronouse device? If so, what I should do in
> device/driver? About asynchronouse device I only know little from EPICS
> IOC Application Developer's Guide(3.13.0beta12 Page105), but it doesn't
> meet my expect.
> 
> May I ask if somebody could give me some suggestions? Any advice & help
> are welcomed.

Read I/O Event Scanning on page 160 of IOC Application Developer's
Guide(3.13.0beta12)

1) At device initialization time call scanIoInit
2) In your interrupt routine call scanIorequest
3) Your DSET must implement get_ioint_info

In your epics base look at

spics/src/dev/testDev/devEventTestIoEvent.c

This is an example that shows how to use I/O event scanning. You, however, will
call scanIoRequest from your interrupt handler.

Marty Kraimer

Experimental Physics and Industrial Control System

Experimental Physics and
Industrial Control System