Abstract:
Recent years witnessed a proliferation of hard x-ray imaging instruments at the synchrotron and laboratory-based facilities that can provide resolutions down to few tens of nanometers. However, tomography at these fine scales is particularly challenging, because of the reduced photon efficiency, higher radiation doses, and inaccuracies of the stages, which leads to noisy, erroneous and highly undersampled datasets. I will present an overview of the current status of mathematical and computational approaches to alleviate these issues in practice; and talk about how these advancements can shape the design and operation of imaging and microscopy instruments in the future.