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Advanced Photon Source Industrial Liaison Office

Welcome to the Advanced Photon Source (APS) Industrial Liaison Office home page. The purpose of this Office is to provide outreach from the APS to the industrial community.

As we develop the Office and this website to better address the needs of industrial users of the APS, both current and prospective, we are soliciting input by requesting projects and measurements that you would like to perform at the APS.

Please complete the form below so that we can begin communicating with you.

Questions? Email aps-i@aps.anl.gov.

General Information

Company Name *required

 

First Name *required

 

Last Name *required

 

Title

Research Specialist, etc.

 

Phone *required

 

E-mail Address *required

 

Address 1 *required

 

Address 2

 

City *required

 

State

 

Zip Code

 

Country

 

Previous involvement with the APS

User Submitted Proposal Employee Consultant None

 

Description of involvement and approximate date (if applicable)

 

Project Information

Project Type

Non-proprietary Proprietary

 

Comments about project type

 

Requested Technique (if known)

None Anomalous and resonant scattering (hard x-ray) Anomalous and resonant scattering (soft x-ray) Biohazards at the BSL2/3 level Coherent x-ray scattering Coherent x-ray scattering (soft x-ray) Diffraction anomalous fine structure Diffuse x-ray scattering EDXD diffraction Fiber diffraction Fluorescence spectroscopy General diffraction Grazing incidence diffraction Grazing incidence small-angle sattering High-energy x-ray diffraction High-pressure diamond anvil cell High-pressure multi-anvil press Inelastic x-ray scattering Inelastic x-ray scattering (1 eV resolution) Intensity fluctuation spectroscopy Large unit cell crystallography Laue crystallography Liquid scattering Macromolecular crystallography Magnetic circular dichroism (XMCD-hard x-ray) Magnetic circular dichroism (XMCD-soft x-ray) Magnetic x-ray scattering Micro-diffraction Micro-XAFS Micro-beam Micro-fluorescence (hard x-ray) Micro-fluorescence (soft x-ray) Multi-wavelength anomalous dispersion Nuclear resonant scattering Pair distribution function Phase contrast imaging Powder ADXD diffraction Powder diffraction Radiography Resonant inelastic x-ray scattering Single-crystal diffraction Single-wavelength anomalous dispersion Small-angle x-ray scattering (SAXS) Subatomic (<0.85 Å) resolution Surface diffraction Surface diffraction (UHV) Time-resolved XAFS Time-resolved x-ray scattering Tomography Ultra-low-temperature (15K) Ultra-small-angle x-ray scattering White laue single crystal-diffraction Wide-angle x-ray scattering X-ray absorption (XANES) X-ray absorption fine structure (XAFS) X-ray emission spectroscopy X-ray lithography X-ray magnetic linear dichroism X-ray optics development/techniques X-ray photoemission electron microscopy X-ray photoemission spectroscopy X-ray photon correlation spectroscopy X-ray raman scattering X-ray reflectivity X-ray standing waves micro-XAS

 

If technique is not known, explain

 

General description of project (should not contain proprietary information) *required

Security Code *