Experimental Physics and
Industrial Control System

[email protected] (Bob Dalesio) · Mon, 3 Oct 94 07:15:40 MDT

2. MVME162LX Flash Memory Corruption

   A design problem has been discovered by the field which can cause
   flash memory to be corrupted after a power cycle.  Apparently Intel has
   redefined the powerdown pin of their flash chip to be "powerdown/ 
   /reset".  

   The MCG fix involves connecting the powerup reset (PURESET* / pin 12 on U5)
   line to pin 12 of the flash chip (U43).

   This problem exists in the following part numbers: MVME162-223,200,
   263,283,233,253,270,271,272,273,280,281,282,210,211,212,213,215,220,
   221,222,260,261,and 262.

   NOTE: This will be covered under warranty repair.  Customers implement-
	 ing this fix themselves will void their warranty.

Experimental Physics and Industrial Control System

Experimental Physics and
Industrial Control System