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X-Ray Microscopy and Imaging

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X-Ray Microscopy and Imaging: Nanodiffraction

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X-Ray Microscopy and Imaging: Microdiffraction

X-ray microdiffraction setup at 2-BM consists of KB microfocussing mirrors (~3 micron minimum spot), four-circle Huber diffractometer, high-precision translation sample stage, two orthogonally-mounted video cameras for viewing sample, fluorescence detector (Si-drift diode) and diffraction detector (a scintillation detector or a CCD). The setup is designed for large incident aperture (~0.5 mm vertically and 1 mm horizontally) with a working distance of ~50 cm. All the motions and detectors are controlled through SPEC. One of the leading applications of the microdiffraction instruments at 2-BM is structural analysis of combinatorial thin-films.

Schematic view of x-ray microdiffraction setup at 2-BM

Recent Publications

•  Jun Cui, Yong S. Chu , Olugbenga O. Famodu, Yasubumi Furuya, Jae. Hattrick-Simpers, Richard D. James, Alfred Ludwig, Sigurd Thienhaus, Manfred Wuttig, Zhiyong Zhang, and Ichiro Takeuchi, “ Combinatorial search of thermoelastic shape-memory alloys with extremely small hysteresis width,” Nature Materials 5 , 286 (2006).

•  F. Tsui, L. He, D. Lorang, A. Fuller, Y.S. Chu, A. Tkachuk and S. Vogt, “ Structure and magnetism of Co a (1- x ) Mn ax Ge b epitaxial films,” Appl. Surf. Sci. 252, 2512-2517 (2006).

•  Young K. Yoo, Qizhen Xue, Yong S. Chu, Shifa Xu, Ude Hangen, Hyung-Chul Lee, Wolfgang Stein, Xiao-Dong Xiang, “Identification of Amorphous Phases in Fe-Ni-Co Ternary Alloy System Using Continuous Phase Diagram Material Chips,” Intermetallics , 14 , 241-247 (2006).

•  Young K. Yoo, Qizhen Xue, Hyung-Chul Lee, Shifan Cheng, X.-D. Xiang, Shifa Xu, Jun He, Yong. S. Chu, S. D. Preite, Samuel E. Lofland, Ichiro Takeuchi, “Bulk Ceramic Synthesis and High-Temperature Ferromagnetism of (In 1-x Fe x ) 2 O 3- s with Cu co-doping ,” Appl. Phys. Lett. 86 , 042506 (2005).

•  F. Tsui, L. He, A. Tkachuk, S. Vogt, Y. S. Chu , “Evidence for Strain Compensation in Stabilizing Epitaxial Growth of Magnetically Doped Germanium,” Phys. Rev. B Rapid Comm. 69 , 81304 (2004).

•  F. Tsui and Y. S. Chu, “Combinatorial Approach- a Useful Tool for Studying Epitaxial Processes in Doped Magnetic Semiconductors,” Macromol. Rapid Commun . 25 , 189-195 (2004).

•  Y.S. Chu, A. Tkachuk, S. Vogt, P. Ilinski, D. A. Walko, D.C. Mancini, E. Dufresne, L. He, and F. Tsui, "Structural Determination of Combinatorial Epitaxial thin films using Microfocused Synchrotron Radiation,” Appl. Surf. Sci. 223 , 214-219 (2004).

•  S. Vogt, Y. S. Chu, A. Tkachuk, P. Ilinski, D. A. Walko, and F. Tsui, “Composition Characterization of Combinatorial Materials by Scanning X-ray Fluorescence Microscopy using Microfocused Synchrotron X-ray Beam,” Appl. Surf. Sci. 223 , 175-182, (2004).

•  F. Tsui, L. He, L. Ma, A. Tkachuk, Y. S. Chu, K. Nakajima, and T. Chikyow, “Novel Germanium-Based Magnetic Semiconductors,” Phys. Rev. Lett . 91 , 177203 (2003).

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