X-Ray Microscopy and Imaging: Nanodiffraction
More info coming soon!
X-Ray Microscopy and Imaging: Microdiffraction
X-ray microdiffraction setup at 2-BM consists of KB microfocussing mirrors (~3 micron minimum spot), four-circle Huber diffractometer, high-precision translation sample stage, two orthogonally-mounted video cameras for viewing sample, fluorescence detector (Si-drift diode) and diffraction detector (a scintillation detector or a CCD). The setup is designed for large incident aperture (~0.5 mm vertically and 1 mm horizontally) with a working distance of ~50 cm. All the motions and detectors are controlled through SPEC. One of the leading applications of the microdiffraction instruments at 2-BM is structural analysis of combinatorial thin-films.
Schematic view of x-ray microdiffraction setup at 2-BM
Jun Cui, Yong S. Chu , Olugbenga O. Famodu, Yasubumi Furuya, Jae. Hattrick-Simpers, Richard D. James, Alfred Ludwig, Sigurd Thienhaus, Manfred Wuttig, Zhiyong Zhang, and Ichiro Takeuchi, “ Combinatorial search of thermoelastic shape-memory alloys with extremely small hysteresis width,” Nature Materials 5 , 286 (2006).
F. Tsui, L. He, D. Lorang, A. Fuller, Y.S. Chu, A. Tkachuk and S. Vogt, “ Structure and magnetism of Co a (1- x ) Mn ax Ge b epitaxial films,” Appl. Surf. Sci. 252, 2512-2517 (2006).
Young K. Yoo, Qizhen Xue, Yong S. Chu, Shifa Xu, Ude Hangen, Hyung-Chul Lee, Wolfgang Stein, Xiao-Dong Xiang, “Identification of Amorphous Phases in Fe-Ni-Co Ternary Alloy System Using Continuous Phase Diagram Material Chips,” Intermetallics , 14 , 241-247 (2006).
Young K. Yoo, Qizhen Xue, Hyung-Chul Lee, Shifan Cheng, X.-D. Xiang, Shifa Xu, Jun He, Yong. S. Chu, S. D. Preite, Samuel E. Lofland, Ichiro Takeuchi, “Bulk Ceramic Synthesis and High-Temperature Ferromagnetism of (In 1-x Fe x ) 2 O 3- s with Cu co-doping ,” Appl. Phys. Lett. 86 , 042506 (2005).
F. Tsui, L. He, A. Tkachuk, S. Vogt, Y. S. Chu , “Evidence for Strain Compensation in Stabilizing Epitaxial Growth of Magnetically Doped Germanium,” Phys. Rev. B Rapid Comm. 69 , 81304 (2004).
F. Tsui and Y. S. Chu, “Combinatorial Approach- a Useful Tool for Studying Epitaxial Processes in Doped Magnetic Semiconductors,” Macromol. Rapid Commun . 25 , 189-195 (2004).
Y.S. Chu, A. Tkachuk, S. Vogt, P. Ilinski, D. A. Walko, D.C. Mancini, E. Dufresne, L. He, and F. Tsui, "Structural Determination of Combinatorial Epitaxial thin films using Microfocused Synchrotron Radiation,” Appl. Surf. Sci. 223 , 214-219 (2004).
S. Vogt, Y. S. Chu, A. Tkachuk, P. Ilinski, D. A. Walko, and F. Tsui, “Composition Characterization of Combinatorial Materials by Scanning X-ray Fluorescence Microscopy using Microfocused Synchrotron X-ray Beam,” Appl. Surf. Sci. 223 , 175-182, (2004).
F. Tsui, L. He, L. Ma, A. Tkachuk, Y. S. Chu, K. Nakajima, and T. Chikyow, “Novel Germanium-Based Magnetic Semiconductors,” Phys. Rev. Lett . 91 , 177203 (2003).