Beamlines and Facilities: Beamline:2-ID-D
The 2-ID-D/E beamline encompasses three hard x-ray microprobes for x-ray fluorescence mapping, fluorescence spectroscopy, and microdiffraction. Station 2-ID-E is an x-ray fluorescence microprobe in a side-branch geometry, which operates in parallel to 2-ID-D. Station 2-ID-D contains an x-ray fluorescence and a micro-diffraction microprobe, which operate exclusively.
Beamline 2-ID-D is devoted to sub-micron high resolution x-ray imaging studies. Most work on the beamline centers on fluorescence analysis of biological samples and micro diffraction of a variety of materials.
BARRY LAI (Micro Fluorescence) - ph: 630.252.6405 ; email: email@example.com
ZHONGHOU CAI (Micro Diffraction) - ph: 630.252.0144 ; email: firstname.lastname@example.org
- Micro fluorescence
- Life Sciences
- Material Science
Beamline and source parameters
- Source: undulator A
- Energy range: 5-32 keV
- Monochromator: Kohzu Si (111), 1.4 x 10-4
- Flux (ph/sec/µm2/0.1% ): 1 x 1011 @ 10 keV
- focused beam: 0.1 x 0.1µm2
- Fresnel Zone Plate optics
- Ge Solid State (Canberra)
- 13-element Ge (Canberra)
- 3-element Ge (Canberra)
- Avalanche photodiodes
- Ionization Chambers
- NaI scintillation
- Newport Kappa diffractometer
- Optical Table with 6 degrees of freedom
- Scanning microscope
- High-resolution x-ray spectrometer
- Offline high resolution visible light microscope (Leica DMXRE) with digital stages and optical fluorescence
 "X-ray microdiffraction images of antiferromagnetic domain evolution in chromium,"
P. G. Evans, E. D. Isaacs, G. Aeppli, Z. Cai, B. Lai,
Science 295, 1042 (2002).
 "Observation of columnar microstructure iin step-graded Si1-xGex/Si films using high-resolution x-ray microdiffraction,"
D. E. Eastman, C. B. Stagarescu, G. Xu, P. M. Mooney, J. L. Jordan-Sweet, B. Lai, Z. Cai,
Phys. Rev. Lett. 88, 156101 (2002).
 "Local mapping of strain at grain boundaries in colossal magnetoresistive films using x-ray microdiffraction,"
Y. -A. Soh, P. G. Evans, Z. Cai, B. Lai, C. -Y. Kim, G. Aeppli, N. D. Mathur, M. G. Blamire, E. D. Isaacs,
J. Appl. Phys. 91, 7742 (2002).
last updated by Stefan Vogt -
April 24, 2007