Beamlines and Facilities: Beamline:2-ID-D

Introduction

The 2-ID-D/E beamline encompasses three hard x-ray microprobes for x-ray fluorescence mapping, fluorescence spectroscopy, and microdiffraction. Station 2-ID-E is an x-ray fluorescence microprobe in a side-branch geometry, which operates in parallel to 2-ID-D. Station 2-ID-D contains an x-ray fluorescence and a micro-diffraction microprobe, which operate exclusively.

Beamline 2-ID-D is devoted to sub-micron high resolution x-ray imaging studies. Most work on the beamline centers on fluorescence analysis of biological samples and micro diffraction of a variety of materials.

Contacts:

Beamline Scientists:

BARRY LAI (Micro Fluorescence) - ph: 630.252.6405 ; email: blai@aps.anl.gov
ZHONGHOU CAI (Micro Diffraction) - ph: 630.252.0144 ; email: cai@aps.anl.gov

Techniques

• Micro fluorescence
• Microprobe
• Micro-diffraction

Discipline

• Life Sciences
• Material Science

Beamline and source parameters

• Source: undulator A
• Energy range: 5-32 keV
• Monochromator: Kohzu Si (111), 1.4 x 10^-4
• Flux (ph/sec/µm²/0.1% ): 1 x 10¹¹ @ 10 keV
• focused beam: 0.1 x 0.1µm²

Instrumentation:

• Fresnel Zone Plate optics
• Ge Solid State (Canberra)
• 13-element Ge (Canberra)
• 3-element Ge (Canberra)
• Avalanche photodiodes
• Ionization Chambers
• NaI scintillation
• Newport Kappa diffractometer
• Optical Table with 6 degrees of freedom
• Scanning microscope
• High-resolution x-ray spectrometer
• Offline high resolution visible light microscope (Leica DMXRE) with digital stages and optical fluorescence

References

[1] "X-ray microdiffraction images of antiferromagnetic domain evolution in chromium,"
P. G. Evans, E. D. Isaacs, G. Aeppli, Z. Cai, B. Lai,
Science 295, 1042 (2002).
[2] "Observation of columnar microstructure iin step-graded Si_1-xGe_x/Si films using high-resolution x-ray microdiffraction,"
D. E. Eastman, C. B. Stagarescu, G. Xu, P. M. Mooney, J. L. Jordan-Sweet, B. Lai, Z. Cai,
Phys. Rev. Lett. 88, 156101 (2002).
[3] "Local mapping of strain at grain boundaries in colossal magnetoresistive films using x-ray microdiffraction,"
Y. -A. Soh, P. G. Evans, Z. Cai, B. Lai, C. -Y. Kim, G. Aeppli, N. D. Mathur, M. G. Blamire, E. D. Isaacs,
J. Appl. Phys. 91, 7742 (2002).

last updated by Stefan Vogt - April 24, 2007