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X-Ray Microscopy and Imaging

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Beamlines and Facilities: Beamline:2-BM

Introduction

The 2-BM beamline offers measurement capabilities for x-ray microtomography, x-ray topography and x-ray microdiffraction. X-ray microtomography and x-ray diffraction instruments are installed on separate optical tables for independent operation with fast switch over time. Optically-coupled high-resolution CCD system is used for microtomography and topography with up to 1 micron spatial resolution. X-ray microdiffraction setup consists of KB microfocussing mirrors (~3 micron minimum spot), four-circle Huber diffractometer, high-precision translation sample stage, two orthogonally-mounted video cameras for viewing sample, fluorescence detector (Si-drift diode) and diffraction detector (a scintillation detector or a CCD).

Three different levels of monochromaticity are available. Conventional monochromatic x-rays from a double-bounced Si (111) crystal monochromator (DCM, D E/E=1E-4), wide band-pass monochromatic x-rays from a double multilayer monochromator (DMM, D E/E=1~4E-2) and pink beam. The available x-ray range is from 5 keV to 30 keV. The lower limit is due to the x-ray windows and the upper limit is due to the critical angle of the x-ray mirror. Two different coatings (Cr and Pt) for the x-ray mirror allow either 20 keV or 30 keV energy cutoff. 

Beamline Scientist:

Xianghui Xiao: xhxio@aps.anl.gov , (630) 252-9621

Francesco De Carlo: decarlo@aps.anl.gov , 630) 252-0148.

Beamline post-doc:

Yongshen Pan: pany@aps.anl.gov , (630) 252-5939

 

Techniques

•  X-ray Tomography

 

Optical Components

Component

Distance from Source

Description

Installed

Filter assembly

23.2 m

8 filters on 2 carriers

05/1996

Hor. and vert. slits

23.5 m

25 µm reproducibility

05/1996

Vert. deflecting mirror

24.9 m

0.15 deg. plane w/ 2 coatings (Cr, Pt)

12/1997

Double multilayer mono.

27.4 m

Unfocussed

05/2000

Hor. and vert. slits

48.3 m

25 µm reproducibility

02/1997

 

Beamline Configurations

White Beam: (2-BM-A)

Beam at sample: 50 x 3 mm 2 (hor x vert), uncollimated

Pink Beam: (2-BM-B)

Beam at sample: 50 x 3 mm 2 (hor x vert), uncollimated

Monochromatic (multilayer): (2-BM-B)

Beam at sample: 25 x 4 mm 2 (hor x vert), E= 0.5-33 keV, dE/E= 10 -2

Detectors

Detector

Manufacturer

Description

Vortex

Radiant technologies

Energy dispersive solid state detector

Coolsnap HQ

Roper, Photometrics

Peltier cooled CCD camera

PCO Edge

PCO

sCMOS

PCO Dimax

PCO

CMOS

Bicron

 

Scintillator Point Detector

Ion Chambers

 

 

2-BM-B X-ray Optics

KB-Mirrors, University of Chicago design

Parabolic refractive x-ray Be lenses

 

Ancillary Equipment

Micropositioning system

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