Beamlines and Facilities: Beamline:2-BM

Introduction

The 2-BM beamline offers measurement capabilities for x-ray microtomography, x-ray topography and x-ray microdiffraction. X-ray microtomography and x-ray diffraction instruments are installed on separate optical tables for independent operation with fast switch over time. Optically-coupled high-resolution CCD system is used for microtomography and topography with up to 1 micron spatial resolution. X-ray microdiffraction setup consists of KB microfocussing mirrors (~3 micron minimum spot), four-circle Huber diffractometer, high-precision translation sample stage, two orthogonally-mounted video cameras for viewing sample, fluorescence detector (Si-drift diode) and diffraction detector (a scintillation detector or a CCD).

Three different levels of monochromaticity are available. Conventional monochromatic x-rays from a double-bounced Si (111) crystal monochromator (DCM, D E/E=1E-4), wide band-pass monochromatic x-rays from a double multilayer monochromator (DMM, D E/E=1~4E-2) and pink beam. The available x-ray range is from 5 keV to 30 keV. The lower limit is due to the x-ray windows and the upper limit is due to the critical angle of the x-ray mirror. Two different coatings (Cr and Pt) for the x-ray mirror allow either 20 keV or 30 keV energy cutoff. 

Beamline Scientist:

Xianghui Xiao: xhxio@aps.anl.gov , (630) 252-9621

Francesco De Carlo: decarlo@aps.anl.gov , 630) 252-0148.

Beamline post-doc:

Yongshen Pan: pany@aps.anl.gov , (630) 252-5939

Techniques

•  X-ray Tomography

Optical Components

Beamline Configurations

Detectors

2-BM-B X-ray Optics

KB-Mirrors, University of Chicago design

Parabolic refractive x-ray Be lenses

Ancillary Equipment

Micropositioning system