SXSPM Research | Highlights

Prototype microscope SXSTM V1 successfully tested at APS beamline 4-ID-C

A prototype microscope was temporarily integrated into an existing endstation at beamline 4-ID-C of the Advanced Photon Source at Argonne National Laboratory. A custom-made support with fluoroelastomer damping was utilized in order to minimize the mechanical vibrations of the beamline at the microscope head. The mounting clamp of the microscope head allowed varying the angle of the sample with respect to the beam axis. Emitted electrons were detected at the tip of a modified commercial scanning probe microscope head. The distance of the tip perpendicular to the sample surface was controlled by a calibrated one-axis linear piezomotor. Total electron yield (TEY) was measured directly from the sample via the sample current method. The elemental far field signature of a 3-nm-thick Cu film fabricated on a Si(001) was detected in the TEY as well as in the tip current.

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