SXSPM | Publications | SXSPM Related
BOOK CHAPTERS
V. Rose, J.W. Freeland, S.K. Streiffer, "New Capabilities at the Interface of X-rays and Scanning Tunneling Microscopy", in Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy, S.V. Kalinin, A. Gruverman, (Eds.), Springer, New York (2011), pg 405-432.
PUBLICATIONS IN PEER-REVIEWED JOURNALS
V. Rose, T.Y. Chien, J.W. Freeland, D. Rosenmann, J. Hiller, V. Metlushko, "Spin-dependent synchrotron x-ray excitations studied by scanning tunneling microscopy", J. Appl. Phys. 111, 07E304 (2012).
M.L. Cummings, T.Y. Chien, C. Preissner, V. Madhavan, D. Diesing, M. Bode, J.W. Freeland, V. Rose, "Combining Scanning Tunneling Microscopy and Synchrotron Radiation for High-Resolution Imaging and Spectroscopy with Chemical, Electronic, and Magnetic Contrast", Ultramicroscopy 112, 22 (2012).
V. Rose, T.Y. Chien, J. Hiller, D. Rosenmann, R.P. Winarski, "X-ray nanotomography of SiO2-coated Pt90Ir10 tips with sub-micron conducting apex", Appl. Phys. Lett. 99, 173102 (2011).
V. Rose, J.W. Freeland, "A New Concept for Quantitative Nanoscale Imaging With Magnetic Contrast: Synchrotron X-ray Enhanced Scanning Tunneling Microscopy", Proceedings of 2010 International Conference on Electromagnetics in Advanced Applications (ICEAA 2010), Sydney, Australia, Sept. 20-24, 2010, pp. 201-204 (invited).
C. Preissner, V. Rose, C. Pitts, "Mechanical Systems for a Synchrotron X-ray Enhanced Scanning Tunneling Microscope", Diamond Light Source Proceedings 1 (2010) e21.
V. Rose, J.W. Freeland, "Nanoscale chemical imaging using synchrotron x-ray enhanced scanning tunneling microscopy", AIP Conf. Proc. 1234 (2010) 445.
V. Rose, J.W. Freeland, K.E. Gray, S.K. Streiffer, "X-ray-excited photoelectron detection using a scanning tunneling microscope", Appl. Phys. Lett. 92 (2008) 193510.