| TITLE |
MANUSCRIPT TYPE |
AUTHOR |
UV/ozone cleaning of silicon optics |
Technical Notes (SRC) |
R.W. Hansen, M. Severson, L. Assoufid, J. Qian |
Variable magnification with Kirkpatrick-Baez optics for synchrotron x-ray microscopy |
Journal Presentation |
T. Jach, A.S. Bakulin, S.M. Durbin, J. Pedulla, A. Macrander |
Beryllium and lithium x-ray lenses at the APS |
Conference Presentation |
A. Khounsary, E.M. Dufresne, K. Young, C.M. Kewish, A.N. Jansen |
Wave-optical simulation of hard x-ray nanofocusing by precisely figured elliptical mirrors |
Journal Article Presentation |
C.M. Kewish, L. Assoufid, A.T. Macrander, J. Qian |
Optics fabrication and metrology for nanofocusing of hard x-rays |
Conference Presentation |
A.T. Macrander, C. Liu, R. Conley, L. Assoufid, A. Khounsary, J. Qian, C.M. Kewish |
Stress mitigation of x-ray beamline monochromators using topography test unit |
Conference Presentation |
J. Maj, G. Waldschmidt, P. Baldo, A. Macrander, I. Koshelev, R. Huang, L. Maj, A. Maj |
Interface roughness evolution in sputtered WSi2/Si multilayers |
Journal of Applied Physics |
Y-P Wang, H. Zhou, L. Zhou, R.L. Headrick, A.T. Macrander, A.S. Ozcan |
Film stress studies and the multilayer laue lens project |
Conference Presentation |
C. Liu, R. Conely, A. Macrander |
Fabrication and performance of lithium compound refractive x-ray lenses |
|
K. Young, A. Khounsary, A.N. Jensen, E. Dufresne, P. Nash |
APS/ESRF/SPring-8 round robin measurements Part II: Asperical mirrors |
Presentation Viewgraphs |
L. Assoufid, J. Qian, A. Macrander |
Diamondoids as molecular building blocks for nanotechnology, drug targeting and gene delivery |
Conference Abstract |
G.A. Mansoori, L. Assoufid, H. Ramezani, T.F. George, G.P. Zhang |
Claire: First light for a gamma-ray lens |
Journal Article |
P. Ballmoos, H. Halloin, J. Evrard, G. Skinner, N. Abrosimov, J. Alvarez, P. Bastie, B. Hamelin, M. Hernanz, P. Jean, J. Knodlseder, B. Smither |
Multilayer-Laue-lens optics for nm x-ray beams |
Conference Presentation |
A.T. Macrander |
Fabrication of optics for nanofocusing of hard x-rays |
Conference Abstract |
A.T. Macrander, C. Liu, R. Conley, L. Assoufid, A. Khounsary, J. Qian, C. Kewish, R. Headrick, Y.P. Wang |
Optics fabrication and metrology at the APS - a status report |
Conference Abstract |
A.K. Macrander |
Microstitching interferometry tool for evaluating high-quality elliptically-shaped K-B mirrors for hard x-ray nanofocusing |
Conference Abstract |
L. Assoufid, A. Macrander, J. Qian, C. Saxer |
Results of aspheric round-robin measurements and other developments at the APS metrology laboratory |
3-Way Optics Workshop |
L. Assoufid, J. Qian, A. Khounsary, C. Kewish,A. Macrander
|
Results from and design of the APS rotary deposition system |
3-Way Optics Workshop |
R. Conley, C. Liu, A.T. Macrander |
|
Thin Solid Films Journal Article |
C. Liu, R. Conley, A. Macrander, J. Maser, H. Kang, G. Stephenson |
|
Review of Scientific Instrument Journal Article |
W. Liu, G. E. Ice, J. Z. Tischler, A. Khounsary, C. Liu, L. Assoufid, A.T. Macrander |
Multilayer laue lens for hard x-ray nanostructure |
Conference abstract |
C. Liu, R. Conley. A.T. Macrander, J. Maser, H.C. Kang, G. Stephenson |
Strain maps with ppm resolution for single crystal wafers obtained from x-ray rocking curve maps |
Meeting abstract |
A. T. Macrander, Y. Zhong, J. Maj, Y.S. Chu,
S. Krasnicki
|
The global high-accuracy intercomparison of slope-measuring instrument |
Conference abstract |
F. Siewert, L. Assoufid, D. Cocco, F. Polack, S. Quian, S. Rah, P. Takacs, M. Thomassett, K. Yamauchi |
Achromatic nanofocusing of hard x-rays with elliptically figured k-b mirrors |
Conference abstract |
A. Khounsary, J. Daniel, G. Ice, W. Liu, L. Assoufid, K. Yamauchi |
Results of aspheric round-robin measurements and other developments at the APS Metrology Laboratory |
Oral presentation abstract |
L. Assoufid, J. Qian, A. Khounsary, C. Kewish, A.T. Macrander |
Results from and design of the APS rotary deposition system |
3-Way conference abstract |
R. Conley, C. Liu, A. Macrander |
Stress mitigation of x-ray beamline monochromators using topography test unit |
Denver X-ray Conference abstract |
J. Maj, G. Waldschmidt, I. Koshelwe, R. Huang, P. Baldo, A. Macrander, L. Maj |
On the fabrication and metrology of x-ray synchrotron radiation mirrors state of-the-art and anticipated challenges |
SRI 2006 Conference abstract |
L. Assoufid |
| Optics Fabrication and Metrology for Nanofocusing of Hard X-rays |
SRMS-5 Conference abstract |
A.T. Macrander, C. Liu, R. Conley, L. Assoufid, A. Khounsary, J. Qian, C. Kewish |
Nanometer focusing of hard x-rays with linear zone-plate multilayer Laue lenses |
Conference abstract for the APS Users Meeting |
C. Liu, R. Conley, A. Macrander, J. Maser, H. Kang, G. Stephenson |
Strain maps with parts-per-million resolution for single crystal wafers obtained from x-ray rocking curves |
Presentation slides for the APS March Meeting |
A. T. Macrander, Y. Zhong, J. Maj, Y.S. Chu, S. Krasnicki |
Film stress studies and the multilayer laue lens project |
Conference abstract for the SPIE 2006 Conference |
C. Liu, R. Conley, A. Macrander |
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