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MANUSCRIPT TYPE
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AUTHORS
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Updates on the APS Metrology Laboratory and Results of the 3-Way Round-Robin Measurements |
Presentation abstract |
L. Assoufid, J. Qian, A.T. Macrander |
Overview of the Optics Fabrication and Metrology Group at the APS |
Presentation abstract |
A.T. Macrander |
Overview of Optics Fabrication and Metrology Group at the APS |
Presentation slides |
A.T. Macrander |
Multilayer Laue Lenses for Nanofocusing of hard X-rays |
Conference abstract |
H-C Kang, G. Stephenson, R. Conley, A.T. Macrander, C. Liu, J. Maser |
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Full length conference paper, Journal of Physics D: Applied Physics 38 (2005) A39-A43 |
Y. Zhong, F. Krasnicki, A.T. Macrander, Y. Chu, J. Maj |
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Technical Notes |
R. Hansen, M. Severson, L. Assoufid, J. Qian |
Uncertainties in Aspheric Profile Measurements with the Geometry Measuring Machine at NIST |
SPIE abstract |
B. Chang Kim, N. Machkour-Deshayes, Q. Wang, J. Soons, U. Griesmann, L. Assoufid |
A Multilayer Nanostructure for Linear Zone-Plate Applications |
Conference abstract |
C. Liu, R. Conley, A. Macrander, J. Maser, H. Kang, M. Zurbuchen, G. Stephenson |
The APS/ESRF/SPring-8 Metrology Round-Robin Campaign |
SPIE Conference abstract |
L. Assoufid, A. Rommeveaux, H. Ohashi, K. Yamauchi, H. Mimura, J. Qian, O. Hignette, T. Ishikawa, C. Morawe, A. Macrander, S. Goto |
Combined Stitching Profiler for Elliptical KB Mirror Metrology |
SPIE Conference abstract |
L. Assoufid, M. Bray |
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2005 APS Users Meeting Abstract |
C. Liu, R. Conley, A. Macrander, J. Maser, H. Kang, G. Stephenson |
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2005 APS Users Meeting Abstract |
L. Assoufid, M. Bray, J. Qian |
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Journal of Applied Physics Article |
C. Liu, R. Conley, A.T. Macrander, J. Maser, H.C. Kang, M.A. Zurbuchen, G.B. Stephenson |
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2005 APS Users Meeting Abstract |
Y. Li, A. Khounsary, S. Nair |
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2005 APS Users Meeting Abstract |
F. Krasnicki, Y. Zhong, A.T. Macrander, J. Maj |
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2005 Users Mtg Poster Abstract |
Y. Zhong, A.T. Macrander, F. Krasnicki, Y.S. Chu, J. Maj |
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Full Length paper for the 13th Int'l Congress on Thin Films |
C. Liu, R. Conley, A. T. Macrander, J. Maser, H. C. Kang, G. B. Stephenson |
Fabrication and Testing of a Lithium Compound Reflective X-Ray Lens |
SRI 2005 Conference abstract |
K. Young, A. Khounsay, A. Jensen, E. Dufresne, P. Nash |
Topographic Testing of Crystals for the Advance Photon Source Users |
Denver X-Ray Conference abstract |
S. Krasnicki, J. Maj, A.T. Macrander, Y. Zhong |
Uncertainties in Aspheric Profile Measurements with the Geometry Measuring Machine at NIST |
SPIE abstract |
U. Griesmann, N. Machkour-Deshayes, J. Soons, B. Chang Kim, Q. Wang, J.R. Stoup, L. Assoufid |
Multilayer Laue Lens for Nanofocusing of Hard X-Rays |
Invited talk-abstract |
Albert Macrander |
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Full length SPIE conference paper |
L. Assoufid, A. Rommeveaux, H. Ohashi, K. Yamauchi, H. Mimura, J. Qian, O. Hignette, T. Ishikawa, C. Morawe, A. Macrander, A. Khounsary, S. Goto |
Investigation of the interface structure in sputtered WSi2/Si Multilayers by In-Situ Synchrotron X-Ray Scattering |
Poster abstract |
Y. Wang, H. Zhou, L. Zhou, R.L. Headrick, A.T. Macrander |
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Full length ICNT 2005 conference paper |
L. Assoufid, G. Ali Mansoori, T. George, G. Zhang |
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Review of Scientific Instruments 76, 113701 (2005) |
W. Liu, G. Ice, J. Tischler, A. Khounsary, C. Liu, L. Assoufid, A. Macrander |
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Applied Physcis Letter Journal Article
Appl. Phys. Lett. ; 87(19): 194113(3) ; Nov. 7, 2005
|
A. Macrander, S. Krasnicki, Y. Zhong, J. Maj, Y. Chu |
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Journal of Applied Physics,
98: 113519(6) ; 2005 |
C. Liu, R. Conley, A. T. Macrander, J. Maser, H. C. Kang, G. B. Stephenson |
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Physical Review Letter Journal Article,
95(12): 125701(5) DOI: 10.1103/PhysRevLett.95.125701 ; Sep. 16, 2005
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Lead APS Author: J. Rudati. Other APS author: A.T. Macrander |
