X-Ray Optics Metrology Laboratory

Instruments

Four instruments are available that cover the spatial frequency range of one Angstrom to 2 meters. These include:

In addition, x-ray generators and synchrotron radiation are used to characterize substrates. Typically, such work is performed as part of ongoing R&D programs or as part of collaborative efforts with the end user.

Contact: Lahsen Assoufid, assoufid@aps.anl.gov

Updated: August 4, 2005