X-Ray Optics Metrology Laboratory

Capabilities

The Metrology Laboratory at the APS can:

• evaluate optical quality of x-ray mirrors and substrates to be used in the APS beamlines, in order to ensure compliance with the user's specifications in terms of figure error and finish.
• characterize x-ray mirror-bender assemblies and specialized optics.
• carry out joint R&D programs to develop new metrology measurement techniques and instrumentation.

Environment

Instruments

R&D Activities

Links to other sites

For questions, contact: Lahsen Assoufid at assoufid@aps.anl.gov

Updated: August 1, 2005