Argonne National Laboratory

Users Week 2009
May 4-6, 2009

Argonne Home > Advanced Photon Source >

X-ray Science Division
Argonne National Laboratory
Building 432, Room E002
9700 S. Cass Avenue
Argonne, IL 60439
USA

Ph: 630.252.0281
Fx: 630.252.0282
Em: asandy@aps.anl.gov

Alec Sandy

Current Position

  • Physicist, X-Ray Science Division, Argonne National Laboratory, 2003-current

Background

  • Senior Consultant, Princeton Consultants, 1998-2003
  • Research Scientist, CMSE, Massachusetts Institute of Technology, 1994-1998
  • Guest Scientist, Risø National Laboratory, 1992-1994
  • Ph.D. Physics, Massachusetts Institute of Technology, 1992
  • B.Sc. Physics, McGill University, 1986

Activities

  • APS SAXS Proposal Review Panel, 2009-current
  • Small-angle scattering Special Interest Group Member at Large, American Crystallographic Association, 2007-current
  • APS construction and commissioning review panel, 2005-present

Interests

  • Dynamics in materials via coherent x-ray scattering (XPCS)
  • Fast area detectors and high performance computing
  • Soft condensed matter
  • Time-resolved small angle x-ray scattering

Goals

  • I have been actively involved on the experiment floor at the APS over a span of 15 years, first as a member of a CAT responsible for designing and implementing an insertion device beamline, and more recently as an APS staff member who led the transition of a CAT beamline to an APS-operated beamline.  I have seen firsthand, therefore, the APS make recent strides in facilitating General User science.  If elected to the APSUO, I will advocate on behalf of users for continued advances in this area, especially where they relate to the need for the APS to remain a first-class facility as new third generation synchrotron facilities begin operation.  Some specifics I believe the APS can continue to improve upon for the benefit of users are superior computing and networking resources, scientific software, detectors, advanced engineering and automation and brilliance-preserving optics.

 

 

 
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