Argonne National Laboratory

Users Week 2008
May 4-8, 2008

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Workshop 10

In-situ Surface Science: Growth and Properties of New Materials

Thu. May 8, afternoon
Lecture Hall

Organizers: Hawoong Hong (University of Illinois at Urbana-Champaign) and Paul Zschack (APS-XSD)

To agenda > Updated 4/10/2008

Surfaces and interfaces provide unique opportunities for fascinating science and for creating novel materials with technological importance. Understanding the structure and properties of these systems requires atomic scale investigations. Synchrotron radiation sources such as the APS provide efficient and sensitive capabilities that permit time resolution down to micro-seconds, and a broad picture of atomic arrangements in 2 and 3 dimensions. These capabilities facilitate the expansion of x-ray studies beyond clean, static surfaces into evolving interfaces during film/island growth, surface modification, etc.  New low-dimensional material systems with exciting novel properties are being developed, and x-ray techniques play a decisive role in the advancement of our knowledge in these systems. In addition to the discussion on these developments, we will explore strategies and new directions particular to in-situ surface science at synchrotron radiation facilities. 

This workshop will focus on surface science as it relates to the growth and properties of new materials.  This often requires large-scale deposition instrumentation such as MBE, CVD, PLD and sputtering, and utilizes various synchrotron based x-ray techniques, including diffraction, GISAXS, XAFS, x-ray standing waves, and imaging.  We will discuss widely varying subjects such as (a) quantum size effects, (b) lattice strain, (c) vacancy formation in thin-films, (d) self assembly of nano-sized objects, and (e) formation of atomically thin layers such as graphene and sapphire.   Because of the great promise for scientific and technological breakthroughs in interfacial science today, it is timely to further explore these research activities and new directions.


May 8, 2008

  Session I: In-situ Growth and Surface Science at APS, Chair: Paul Zschack
1:25 - 1:30 Opening Remarks
Paul Zschack
1:30 - 1:55 Growth studies of nanostructured surfaces at sector 6
Paul Micheli, University of Missouri, Colombia
1:55 - 2:20

Redox induced adsorption geometry changes in supported metal-oxide catalysts
Chang-Yong Kim, Canadian Light Source

2:20 - 2:45 Direct Evidence for Mesoscopic Relaxations in Cobalt Nanoislands on Cu(001) by Surface X-Ray Diffraction
Holger M. Meyerheim, Max-Planck-Institut für Mikrostrukturphysik, Halle
2:45 - 3:10

Quantum size effecst of ultra-thin metal films- Real time studies with 3-D reciprocal space mapping
Hawoong Hong, University of Illinois at Urbana-Champaign

3:10 - 3:30 Break
  Session II: New materials and directions for in-situ x-ray works, Chair: Hawoong Hong
3:30 - 3:55 Magnetic doping of thin film semiconductors and silicide nanowires
Hanno Weitering, University of Tennessee
3:55 - 4:20 The structure of the crystalline oxide on silicon interface - experimental determination
Fred Walker, Yale University
4:20 - 4:45

Solid state decomposition of Zinc Oxide nanocrystal surfaces
Steven Leake, University College London

4:45 Adjourn



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