Argonne National Laboratory

Users Week 2007
May 7-12, 2007

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Registration & Abstracts
Practical Matters

- April 9: poster abstracts
- April 10: non-U.S. registration
- April 22: housing
- April 23: registration


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For Organizers


Past Meetings


Workshop 9 - Center for Nanoscale Materials & Electron Microscopy Center

Thursday, May 10
Bldg. 402, Rm. E1100/E1200
Session I: Atom Probe Tomography
Session II. Image Reconstruction
Session III: Electron Microscope Tomography
Bldg. 402, Lecture Hall
Session IV: X-ray Nanotomography, combined session with Workshop 8

Derrick Mancini, Center for Nanoscale Materials (Session I & II)
Bernd Kabius, Electron Microscopy Center (Session III)
Jörg Maser, Center for Nanoscale Materials and Advanced Photon Source (Session IIV)
Mark Rivers, The University of Chicago (Session IV)

To agenda > (updated 4/21/07)

WK9 - Nanotomography


Providing new materials requires atomic-level knowledge that is critical to enhance our fundamental understanding of the origins of the novel physics and chemistry that are observed at the nanometer scale. Structure and local chemistry at the nanometer scale of defects or at interfaces and surfaces have a strong effect on structures that are small enough that quantum effects are important.  Further advance requires this knowledge in 3 dimensions at the atomic-scale. Due to structure at the interface or the 3-dimensional properties of a nanostructure itself the typical approach of orienting an ideal flat interface edge-on or preparing surfaces and then acquiring 2D elemental or structural maps is no longer sufficient.  Ideally, one desires a full 3 dimensional measurement or representation of the structure, its composition, and its chemical state.

Today, the imaging of x-rays, electrons, and ions allow the 3 dimensional reconstruction of materials and structures at the nanometer and atomic scales.  These approaches to imaging and reconstruction can all be described as tomographic techniques.  X-ray tomography will allow the measurement in 3 dimensions to 30nm resolution including determination of  electron density quantitatively, enhance contrast by use of phase imaging techniques, allow the correlation to chemical state measurements by fluorescence detection, and allow measurements in special environments or strong external fields.  Moreover, the technique can be used nondestructively, and with progress in imaging, can achieve greater resolution.  Electron microscope tomography enables nearly atomic-scale resolution and the correlation to defect structures.  Atom probe tomography can determine the atomic and isotopic composition of a material with sub-atomic resolution.  While no single tomographic technique can obtain all the desired information on a sample, the availability and complementary nature of these three tomographic techniques will allow us to measure and visualize materials in 3 dimensions in much they way that scanning probe microscopy techniques allow us to do in 2 dimensions.  This workshop will review the current and future capabilities and opportunities for atomic and nano-scale tomography to impact the progress of nanoscience.



Session I. Atom Probe Tomography

9:00 - 9:15

Opening Remarks

9:15 - 9:45

Future Directions in Atom Probe Tomography:  Organic Materials Analysis
Ty Prosa, Imago Scientific Instruments

9:45 - 10:30

Atom Probe Tomography and Materials Informatics: New Insights into Materials Design
Simon P. Ringer, Australian Key Centre for Microscopy & Microanalysis, The University of Sydney

10:30 - 11:00

Exploring Three-Dimensional Space at the Subnanometer Scale Using Atom-Probe Tomography
David Seidman, Northwestern University

11:00 - 11:15 Break
  Session II. Image Reconstruction
11:15 - 12:00 Image Reconstruction Problems for Nanotomography
Mark Anastasio, Illinois Institute of Technology
12:00 - 1:30 Lunch

Session III. Electron Probe Tomography

1:30 - 2:00

Challenges in Biological Electron Tomography
Michael Marko, Wadsworth Center, New York State Department of Health

2:00 - 2:30

Electron Tomography – A New Perspective for Materials Microscopy
Paul Midgley, University of Cambridge

2:30 - 3:00

High Resolution Single and Dual Axis Tomography to Solve Materials Problems in Three Dimensions
Ilke Arslan, Sandia National Laboratories

3:00 - 3:15



Session IV. X-ray Nanotomography

  Remainder of session held jointly with WK8 (Hard X-ray Nanoprobe), in Lecture Hall
3:15 - 3:45

Hard X-ray Nano-Imaging and Tomography Using a Full-field Microscope
Christoph Rau, Argonne National Laboratory

3:45 - 4:15

Nanotomography: A Next Generation of High-resolution X-ray Microscopes
Michael Feser, Xradia, Inc.

4:15 Adjourn


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