Registration & Abstracts


Practical Matters




-Description added (3.10)


Workshop 7

Thursday, May 4
Bldg. 401, Rm. A1100
8:30 am - 12:00 pm
1:30 pm - 5:00 pm

Texture and Strain Mapping with X-rays, Neutrons, and Electrons

Dean R. Haeffner, Advanced Photon Source, Argonne National Laboratory
James W. Richardson, Jr., Intense Pulsed Neutron Source, Argonne National Laboratory
Dean J. Miller, Electron Microscopy Center, Argonne National Laboratory

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Information on the orientation of grains and the way that macroscopic strain is distributed among grains is crucial for understanding the mechanical properties of polycrystalline materials. For composite systems, knowledge of the behavior of the different constituent materials is often difficult or impossible to obtain with macroscopic experimental methods. For material that is formed into mechanical components, a part’s shape can lead to strong strain gradients under applied load.

Diffraction measurements with x-rays, neutrons, or electrons can determine the texture and strain as a function of position in a material, with each probe having its own particular advantages. Recent improvements in the capabilities of synchrotron light sources, neutron sources, and electron microscopes have led to increased numbers of experiments that use texture and strain mapping. This workshop will feature talks in a wide variety of scientific areas, using one or more of the three probes for mapping studies.

Agenda as of April 14, 2006

8:30 - 8:40 Welcome
8:40 - 9:10 Strain Pole Figures
Tom Holden, Northern Stress Technologies, Deep River, Ontario, Canada
9:10 - 9: 40

Quantitative Strain Analysis Using Synchrotron X-ray Data
Matt Miller, Cornell University

9:40 - 10:10

Electron Backscatter Diffraction and Orientation Imaging Microscopy for Strain, Texture, and Microstructural Characterization
Matt Nowell, EDAX Inc. / TSL

10:10 - 10:30 Break
10:30 - 11:00

Through-Thickness Grain Structure in YBa2Cu3O7 Films Using EBSD
Matthew Feldmann, University of Wisconsin-Madison

11:00 - 11:30

Temperature and Direction Dependence of Internal Strain and Texture Evolution during Deformation of Uranium
Don Brown, Los Alamos National Laboratory

11:30 - 12:00 High-Energy X-ray Scattering and Mapping in Mineralized Tissue: Sea Urchin Teeth and Bones under Load
Stuart Stock, Northwestern University
12:00 - 1:30 Lunch
1:30 - 2:00

New Scientific Opportunities in Engineering Studies at the Spallation Neutron Source
Xun-li Wang, Oak Ridge National Laboratory

2:00 - 2:30

Accurate Indexing of YBCO Superconductor EBSD Patterns, Determination of Spatial Resolution and Grain Boundary Maps of Boundaries with the Total Misorientation Separated into In-Plane and Out-of-Plane Misorientation Components
Amit Goyal, Oak Ridge National Laboratory

2:30 - 3:00

Strain Mapping at the APS 1-ID Beamline
Jon Almer, Argonne National Laboratory

3:00 - 3:20 Break
3:20 - 3:50

Performance and Initial Studies at the New ORNL Neutron Residual Stress Mapping Facility
Cam Hubbard, Oak Ridge National Laboratory

3:50 - 4:20

Depth-Resolved Stress Profiling in Nanocrystalline Films with Sub-Micron Resolution
Gang Chen, Argonne National Laboratory

4:20 - 4:50 3D Texture and Strain Mapping with Polychromatic Micro/Nano Beams
Gene Ice, Oak Ridge National Laboratory
4:50 - 5:00 Wrap-up