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Workshop 4

Tuesday, May 2
Bldg. 402, Lecture Hall
8:30 - 4:20 pm

Microscopy and Imaging in Materials Science (Advanced Photon Source and Center for Nanoscale Materials)

Organizers:
Qun Shen and Brian Stephenson, Argonne National Laboratory

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Most of our fundamental knowledge to date on solid state physics is built upon research on ideal uniform materials or statistically averaged ensembles of structures. As materials scientists focus more attention on the structure-function correlations in functional materials, spatially resolved, in-situ, structural studies at nanometer length scales on nonuniform, inhomogeneous materials become increasingly important. Because of this, x-ray microscopy and imaging have emerged as a growing area of synchrotron science that is ideally suited for studying structure and evolution of inhomogeneities in a vast range of materials at micrometer to nanometer scales. 

These microscopy and imaging experiments range from structural studies under external gradients in functioning units such as nano-electro-mechanical and multiferroic devices, to in-situ observations of corrosion and crack propagation in alloys, to nanoscale characterizations of individual local functioning domains in macroscopically homogeneous materials such as grain boundaries in engineering materials, solar cells with efficient transport properties, and local crystallographic phases in high-Tc superconductor and giant magnetoresistive thin films.  In addition, the energy tunability of synchrotron x-rays allows near-absorption-edge microspectroscopy and spatially resolved anomalous/resonant scattering studies of chemical states and chemical/orbital ordering in a variety of technologically important materials.

This full-day workshop aims to highlight the most recent advances in areas of materials science with synchrotron x-ray microscopy and imaging. Topics to be discussed will include both novel materials applications using existing, well-established techniques and emerging developments that may open up new areas of research in materials sciences.

Confirmed agenda, April 11, 2006

8:30 Welcome
J. Murray Gibson, Argonne National Laboratory
8:45 High-resolution 3D X-ray microscopy for investigating materials microstructure
Bennett Larson, Oak Ridge National Laboratory
9:15 In-situ synchrotron x-ray microtomography studies of corrosion aluminum and magnesium alloys
Alison Davenport, University of Birmingham, UK
9:45 Defect engineering in Si solar cells
Tonio Buonassisi, University of California, Berkeley & Lawrence Berkeley National Laboratory
10:15 Break
10:40 Imaging nanomagnetic systems and dynamics
Samuel Bader, Argonne National Laboratory
11:10 X-ray reflection phase-contrast microscopy of interfaces
Paul Fenter, Argonne National Laboratory
11:40 Controlled synthesis of novel epitaxial films of Si-based magnetic semiconductors
Frank Tsui, University of North Carolina
12:10 Lunch
13:30 X-ray Imaging with ultra-small angle X-ray scattering as a contrast mechanism
Gabrielle Long, Argonne National Laboratory
14:00 Structure and dynamics in functional materials
Paul Evans, University of Wisconsin, Madison
14:30 Fluctuation X-ray microscopy, and what it tells us about medium-range order in self-assembled materials
Michael Treacy, Arizona State University
15:00 Break
15:20 Nondestructive three-dimensional imaging of nanostructured materials by using coherent x-rays
Jianwei Miao, University of California, Los Angeles
15:50 First results on ultrafast coherent diffraction imaging using a free-electron laser
Stefano Marchesini, Lawrence Livermore National Laboratory
16:20 Adjourn