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Workshop 8

Applications of Grazing-Incidence Small-Angle X-ray Scattering

Friday, May 6, 2005
Location: Bldg. 402, Room E1100/E1200

Organizers: Jin Wang, Advanced Photon Source, and Randall Winans, Chemistry Division, Argonne National Laboratory

As an increasingly important structural-characterization technique, grazing-incidence small-angle scattering (GISAXS) finds vast application in nanostructures and nanocomposites at surfaces and interfaces. Most significantly, as a complementary method to conventional surface-sensitive tools such as scanning probe microscopy and electron microscopy, GISAXS can be used in situ and in real time to monitor the formation of a nanostructure or nanocomposite. This capability makes it especially suitable for studying the kinetics of nanoassembly processes. This workshop will focus on the applications of GISAXS and the current technical capability at the APS to support general users in this area.

Scheduled revised May 5, 2005; note new start and end times.

8:25 am Opening Remarks


The Science and Technology of Self-assembly of Block Copolymer Thin Films
Edward Kramer, University of California, Santa Barbara

9:10 Grazing-Incidence X-ray Scattering Studies of Nanoscale Liquids and Block Copolymer Thin Films
Benjamin Ocko, Brookhaven National Laboratory
9:40 Self-directed Assembly of Nanoparticles/Copolymer Mixtures
Yao Lin, University of Massachusetts, Amherst
10:10 Break


GISAXS Study of Buried Au Nanoparticles in a Thin-film Polymer Matrix
Dong-Ryeol Lee, Argonne National Laboratory

10:40 Challenges in the Application of GISAXS to Characterize Nanoporous Films Supported on Silicon Wafers
Wen-li Wu, National Institute of Standards & Technology

Break (Secretary of Energy speaking at ~11:30 in Lecture Hall)

1:00 pm Analysis of Buried Nanostructures by GISAXS
David Babonneau, CNRS/Université de Poitiers


Anomalous Grazing Incidence Small-Angle X-ray Scattering Studies of Platinum Nano Particles Formed by Cluster Deposition
Byeongdu Lee, Argonne National Laboratory

2:00 - 3:00 Tour of beamlines 8-ID-E and 12-ID-C

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