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2005
2004

Workshop 4

The Art of Collecting Good Diffraction Data

Thursday PM, May 5, 2005
Friday AM, May 6, 2005
Location: Bldg. 401, Room A1100

Organizers:  Zbigniew Dauter, National Institutes of Health and Argonne National Laboratory, and Stephan Ginell, Argonne National Laboratory

 

Session I: Thursday

1:30 pm

Introduction

1:35

Contemporary Crystal Growth
Youngchang Kim, Argonne National Laboratory

2:15

Data Collection Procedures
Zbigniew Dauter, National Institutes of Health and Argonne National Laboratory

2:55

Reflection Integration, Scaling, Merging
Jim Pflugrath, Rigaku/Molecular Structure Corporation

3:35

Break

3:55

Detector Optimization
Chris Nielsen, Area Detector Systems Corporation

4:35

MAD/SAD Data Optimization
K.R. Rajashankar, Memorial Sloan-Kettering Cancer Center

5:15

Session I Adjourns

 

Session II: Friday

9:00 am

High-Quality vs. High-Throughput Data Collection: Finding the Right Balance
Paula Fitzgerald, Merck Research Laboratories

9:40

Radiation Damage
Udupi A. Ramagopal, Brookhaven National Laboratory

10:20

Break

10:40

Pathological Cases
Alexander Wlodawer, National Cancer Institute

11:20

Panel Discussion -- Tips on Maximizing your Data Collection Success
Speakers and Beamline Representatives

12:00 pm

Workshop Adjourns


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