Workshop 4
The Art of Collecting Good Diffraction Data
Thursday PM, May 5, 2005
Friday AM, May 6, 2005
Location: Bldg. 401, Room A1100
Organizers: Zbigniew Dauter, National Institutes of Health and Argonne National Laboratory, and Stephan Ginell, Argonne National Laboratory
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Session I: Thursday |
1:30 pm |
Introduction |
1:35 |
Contemporary Crystal Growth
Youngchang Kim, Argonne National Laboratory
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2:15 |
Data Collection Procedures
Zbigniew Dauter, National Institutes of Health and Argonne National Laboratory
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2:55 |
Reflection Integration, Scaling, Merging
Jim Pflugrath, Rigaku/Molecular Structure Corporation |
3:35 |
Break |
3:55 |
Detector Optimization
Chris Nielsen, Area Detector Systems Corporation |
4:35 |
MAD/SAD Data Optimization
K.R. Rajashankar, Memorial Sloan-Kettering Cancer Center |
5:15 |
Session I Adjourns |
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Session II: Friday |
9:00 am |
High-Quality vs. High-Throughput Data Collection: Finding the Right Balance
Paula Fitzgerald, Merck Research Laboratories |
9:40 |
Radiation Damage
Udupi A. Ramagopal, Brookhaven National Laboratory |
10:20 |
Break |
10:40 |
Pathological Cases
Alexander Wlodawer, National Cancer Institute |
11:20 |
Panel Discussion -- Tips on Maximizing your Data Collection Success
Speakers and Beamline Representatives
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12:00 pm |
Workshop Adjourns |
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