X-ray specular reflectivity study
of a critical binary fluid mixture
L.W. Marschand, M. Brown, L.B. Lurio, B.M.
Law, S. Uran, I. Kuzmenko, T. Gog
PHYSICAL REVIEW E
72 (1), 011509-1-011509-5 (July 2005)
We have used direct inversion of x-ray reflectivity data to extract the liquid-vapor
interface composition profile and the related critical scaling function of
a binary mixture of dodecane and tetrabromoethane. The mixture was in the
one-phase region above its critical point. The results indicate the formation
of a monolayer of the lower surface tension component followed by an abrupt
change to a mixed composition which gradually relaxes to the bulk composition
deep within the fluid.