Sector 7: APS User Activity Reports for MHATT-CAT experimenters.
The current set of User Activity Reports submitted by MHATT-CAT users is listed below.
They may be viewed in pdf format by clicking on the links.
MHATT-CAT Contributions to the 2001 APS Activity Report
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Picosecond Laser-Pump, X-ray Probe Spectroscopy of GaAs.
B.W. Adams
Advanced Photon Source, Argonne National Lab, Argonne, IL 60439
M.F. DeCamp, E.M. Dufresne, D.A. Reis
Department of Physics, University of Michigan, Ann Arbor MI 48109-1120
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X-ray Diffractive Casimir Effect.
B.W. Adams
Advanced Photon Source, Argonne National Lab, Argonne, IL 60439
E.M. Dufresne, D.A. Walko
MHATT-CAT, APS Sector 7, Argonne National Lab, Argonne, IL 60439
Picosecond Switching of X-rays using the Boorman Effect
M.F. DeCamp, D.A. Reis, P.H. Bucksbaum, R. Clarke, R. Merlin, A. Cavalieri,
E.M. Dufresne, D.A. Arms
Department of Physics, University of Michigan, Ann Arbor, MI 48109-1120 USA
A. Lindenberg, A MacPhee
University of California, Berkeley, CA 94720
Z. Chang
Physics Department, Kansas State University, Manhattan KS 66506
Resonant microdiffraction imaging of polarization switching in ferroelectric
SrBi2Ta2O9
P.G. Evans, E.D. Isaacs
Bell Laboratories, Lucent Technologies, 700 Mountain Avenue, Murray Hill, NJ 07974-0636
G.R. Kowach
Agere System, Murray Hill NJ 07974
E.M. Dufresne
University of Michigan and MHATT-CAT, Ann Arbor MI 48109-1120
A. Pignolet, H.N. Lee
Max-Planck-Institut fur Mikrostructurphysik, Halle/Saale, Germany
Lithium x-ray Refractive Lenses
N.R. Pereira
Ecopulse Inc, Springfield, VA, USA.
E.M. Dufresne, D.A. Arms, R. Clarke, S. B. Dierker
Department of Physics and MHATT-CAT, University of Michigan, Ann Arbor MI USA
Direct structure determination of epitaxially grown films
M. Sowwan, Y. Yacoby
Racah Institute of Physics, Hebrew University, Jerusalem 91904 Israel
J. Pitney, R. MacHarrie, M. Hong
Bell Laboratories, Lucent Technologies, 700 Mountain Avenue, Murray Hill,
NJ 07974-0636
D.A. Walko, R. Clarke
Department of Physics, University of Michigan, Ann Arbor MI 48109-1120.
R. Pindak
National Synchrotron Light Source, Brookhaven National Lab, Upton NY 11973
J. Cross, E.A. Stern
Department of Physics, University of Washington, Seattle, WA
Small angle scattering studies of ordered organosilicate composites
S. Yang, P.G. Evans
Bell Laboratories, Lucent Technologies, 700 Mountain Avenue, Murray Hill, NJ 07974-0636
E.M. Dufresne
University of Michigan and MHATT-CAT, Ann Arbor MI 48109-1120
MHATT-CAT Contributions to the 2000 APS Activity Report
Crystallographic Tilting of Oxide Films on Textured Metal
Substrate Investigated Using X-Ray Microbeams
J.D. Budai, W. Yang, B.C. Larson, G.E. Ice, J.Z. Tischler, D.P. Norton,
J.-S. Chung, C. Park.
Oak Ridge National Laboratory, Oak Ridge, TN 37830 USA
W. Lowe.
Howard University, Washington DC USA.
Dynamics of Nanomagnetic MR Elastomers
R. Clarke, W.F. Schlotter, C. Cionca, S.S. Paruchuri, J.B. Cunningham,
E.M. Dufresne, S.B. Dierker, D.A. Arms
Department of Physics, University of Michigan, Ann Arbor MI USA.
J.M. Ginder and M.E. Nicols
Ford Motor Company, Reasearch Laboratory, Dearborn, MI 48121-2053 USA
A White and Monochromatic X-ray Beam Imaging System
E.M. Dufresne, S. B. Dierker
Department of Physics, University of Michigan, Ann Arbor MI USA.
Li-based Compound X-ray Refractive Lenses
E.M. Dufresne, S. B. Dierker
Department of Physics, University of Michigan, Ann Arbor MI USA
N.R. Pereira
Ecopulse Inc, Springfield, VA, USA.
Visualization of Domain Inverted Regions in Periodically
Poled Lithium Niobate Using X-ray Microdiffraction
P.G. Evans, E.D. Isaacs
Bell Laboratories, Lucent Technologies, Murray Hill NJ 07974 USA
E.M. Dufresne
Department of Physics, University of Michigan, Ann Arbor, MI 48109-1120 USA
Application of Synchrotron Radiation to In-situ Measurement of Delayed Ettringite Formation
R.A. Livingston
Federal Highway Administration, McLean VA 22101 USA
R. Clarke, E.M. Dufresne, E.L. Williams, Jr,
Department of Physics, University of Michigan, Ann Arbor, MI 48109-1120 USA
W. Lowe
Howard University, Beltsville, MD 20705 USA
Studies of Dynamic Critical Behavior of Polymer Mixtures
Using X-ray Photon Correlation Spectroscopy
T. Nurushev, E.M. Dufresne, S. B. Dierker
Department of Physics, University of Michigan, Ann Arbor MI USA
Dynamical Diffraction Effects and the Ultrafast Modulation of X-rays
D.A. Reis, M.F. DeCamp, P.H. Bucksbaum, J.M. Caraher, R. Clarke, E.M. Dufresne,
R. Merlin, V.A. Stoica, J. Wahlstrand
Department of Physics, University of Michigan, Ann Arbor, MI 48109-1120 USA
C.W.S. Conover
Colby College, Waterville, Maine, 04901 USA
Bernhard Adams
Advanced Photon Source, Argonne National Lab, Argonne IL 60439
Contrast Mechanisms in X-ray Microdiffraction Laue Images
F.J. Walker, R. Barabash, G.E. Ice, B.C. Larson, J.Z. Tischler
Oak Ridge National Laboratory, Oak Ridge, TN 37830 USA
Automatic Indexing of Laue Images by Pattern Recognition
F.J. Walker, G.E. Ice
Oak Ridge National Laboratory, Oak Ridge, TN 37830 USA
Bragg-rod Diffraction Studies of the Gd2O3-GaAs Interface
Y. Yacoby
Racah Institute of Physics, Hebrew University, Jerusalem 91904 Israel
R. Pindak, J. Pitney, R. MacHarrie
Bell Laboratories, Lucent Technologies, 700 Mountain Avenue, Murray Hill,
NJ 07974-0636
E.M. Dufresne, R. Clarke
Department of Physics, University of Michigan, Ann Arbor MI 48109-1120.
E. Stern, J. Cross
University of Washington, Seattle, WA
MHATT-CAT Contributions to the 1995-1999 APS Activity Report
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X-ray Microdiffraction Studies of Strain and Texture in Al Interconnects
N. Tamura, J. -S. Chung, G. E. Ice, B. C. Larson, J. D. Budai, J. Z. Tischler, and
Oak Ridge National Laboratory, Oak Ridge, TN 37830 USA
W. P. Lowe and E. L. Williams
Howard U., Washington, DC 20059 USA
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3-D Measurement of Crystal Microstructure with Submicron Polychromatic X-ray Beams
B. C. Larson, N. Tamura, J. -S. Chung, G. E. Ice, J. D. Budai, J. Z. Tischler, W. Yang, and W. P. Lowe
Oak Ridge National Laboratory, Oak Ridge, TN 37830 USA
H. Weiland
Alcoa Technical Center, Alcoa Center, PA 15069 USA
W. P. Lowe
Howard University, Washington, DC 20059 USA
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X-ray Optics for Polycrystalline Microdiffraction
G. E. Ice, B. C. Larson, J. -S. Chung, N. Tamura, J. Z. Tischler, J. D. Budai, and M. Yoon
Oak Ridge National Laboratory, Oak Ridge, TN 37830 USA
W. P. Lowe and E. L. Williams
Howard University, Washington, DC 20059 USA
Lahsen Assoufid
Argonne National Laboratory, 9700 S. Cass Ave., Argonne, IL 60439 USA
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Direct Structure Determination of Systems with Two-Dimensional Periodicity
Y. Yacoby
Racah Institute of Physics, Hebrew University, Jerusalem 91904 Israel
R. Pindak, R. MacHarrie, J. Pitney
Bell Laboratories, Lucent Technologies, 700 Mountain Avenue, Murray Hill, NJ 07974-0636
R. Clarke
Randall Laboratory of Physics, University of Michigan, Ann Arbor, MI 48109-1120 USA
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A Study of Concentration Fluctuations in the Binary Mixture Hexane-Nitrobenzene with
X-ray Photon Correlation Spectroscopy
E. Dufresne, T. Nurushev, R. Clarke, and S. B. Dierker
Randall Laboratory of Physics, University of Michigan, Ann Arbor, MI 48109-1120 USA
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Picosecond Time-resolved X-ray Diffraction at the APS Sector 7 (MHATT-CAT)
D. A. Reis, P. H. Bucksbaum, R. Clarke, M. DeCamp, E. Dufresne, M. Hertlein, R. Merlin, and E. Williams
University of Michigan, Ann Arbor, MI 48109-1120 USA
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Direct Measurement of the Time Structure of Ultrashort X-ray Pulses
D. Walton
Howard University, Washington DC 20059 USA
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X-ray Radiation Damage Effects in Ps/Pbd Polymer Mixtures
T. Nurushev, E. Dufresne, and S. B. Dierker
Randall Laboratory of Physics, University of Michigan, Ann Arbor, MI 48109-1120 USA
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A Fixed Angle Double Mirror Filter for Producing a Pink Undulator Beam at the APS
E. Dufresne, T. Sanchez, T. Nurushev, and S. B. Dierker
Randall Laboratory of Physics, University of Michigan, Ann Arbor, MI 48109-1120 USA
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Local Electronic Structural Studies of Transition Metal Oxides: Magneto-Structural Correlations
T. A. Tyson, H. Woo, L. Dieng, C. Cui
New Jersey Institute of Technology, University Heights, NJ 07102 USA
R. F. C. Farrow
IBM Almaden Research Center, San Jose CA 95120 USA
W. P. Lowe
Howard University, Washington DC 20059 USA
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Speckle Analysis of Relaxation Dynamics in Magnetorheological Elastomers
W. Schlotter, S. Paruchuri, P. Erncarnacion, E. Dufresne, S. B. Dierker, and R. Clarke
Randall Laboratory of Physics, University of Michigan, Ann Arbor, MI 48109-1120 USA
J. M. Ginder and M. E. Nichols
Ford Research Laboratory, Dearborn, MI USA
Last updated by Eric Dufresne
on 10/18/2002.
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