Description

Beamline 4-ID-C focuses on polarization dependent soft x-ray spectroscopic studies, which probe the electronic and magnetic properties of a wide variety material systems. The x-ray source on this beamline is a unique electromagnetic undulator capable of delivering both vertical and horizontal linear as well as circular polarization over the spectral ranges given below:

• Circular: 500 to 2800 eV (switchable at 0.5 Hz)
• Linear Horizontal: 700 to 2800 eV
• Linear Vertical: 700 to 2800 eV

Supported Techniques

• Magnetic circular dichroism (x-ray magnetic circular dichroism, soft x-ray)
• X-ray magnetic linear dichroism
• X-ray photoemission spectroscopy
• X-ray photoemission electron microscopy
• Anomalous and resonant scattering (soft x-ray)

Beamline Controls and Data Acquisition

EPICS-based control system with ScanSee data viewing software.

Detectors

• Total electron yield
• Total fluorescence yield (SII-Vortex)

Additional Equipment

• High-Field Superconducting Magnet
  XAS and XMCD spectroscopy at ±6.5 Tesla
• Low-Field Electromagnet
  XAS and XMCD studies in ±0.1 Tesla
• X-PEEM
  Spatial (~100nm) and temporal (~100ps) magnetic imaging
• XPS chamber
  Electronic structure at surfaces

Local Contacts

Beamline Specs