In situ powder diffraction studies at 1-BM
Understanding the structural development of materials during synthesis and the synergy between a material’s structural and functional properties, often referred to as a ‘structure-property relationship’, is critical in developing new materials for industrially important applications. In situ x-ray scattering studies offer a powerful approach to achieve this understanding. Such studies involve the design and implementation of experiments to ‘watch’ changes in materials structures and their properties under conditions that mimic real-world applications. Programs dedicated to in situ X-ray scattering studies of the synthesis and characterization of functional materials have been developed at the 1-BM beamline over the past 2-3 years. 1-BM is a moderate resolution X-ray powder diffraction instrument, optimized for in situ measurements under non-ambient conditions (variable temperature, controlled-atmosphere, and elevated pressures), and is capable of taking data with time resolutions from fractions of seconds using a state-of –the-art flat panel detector.
For more information contact Greg Halder or John Okasinski.
Last updated: June 15, 2011