Strain and texture scanning at 1-ID
We utilize high-energy x-rays and a transmission geometry to measure internal strain and crystallographic texture in polycrystalline materials.
For an example and introductory description of these measurements see the links to the left, with the latter developed for the annual neutron and x-ray summer school at Argonne. We also provide a link to the Vamas synchrotron strain standard, which is an ongoing effort to standardize residual strain mapping measurements at synchrotron sources.
Selected References:
Noyan, I.C. and J.B. Cohen, "Residual Stress: Measurement by Diffraction and Interpretation", Springer-Verlag, Berlin (1989).
Hauk, V. (editor), "Structural and Residual Stress Analysis by Nondestructive Methods", Elsevier Science Ltd, Amsterdam (1997).
Kocks, U.F, C.N. Tome and H.R. Wenk, "Texture and Anisotropy: Preferred Orientations in Polycrystals and Their Effect on Materials Properties", Cambridge Univ. Press (1998).
Randle, V. and O. Engler, "Introduction to Texture Analysis", Harwood Academic (2000).