Jonathan Almer
Argonne National Laboratory
9700 S. Cass Ave
431/A006
Argonne, Il 60439
Phone: 630-252-1049
Fax: 630-252-5391
E-Mail: almer@aps.anl.gov
Education/Experience:
- Northwestern University, Department of Materials Science and Engineering, Evanston, IL; Ph.D., 1998
- North Park University, Chicago, IL; B.S. in Physics, 1991
- 2008 - present: Physicist, X-ray Science Division, Argonne National Laboratory, Argonne, IL
- 2003- 2007: Assistant Physicist, X-ray Science Division, Argonne National Laboratory, Argonne, IL.
- 2000-2003: Postdoctoral Research Associate, Experimental Facilities Division, Argonne National Laboratory, Argonne, IL
- 1998-2000: Postdoctoral Research Associate, Engineering Materials Division, Linköping University, Linköping, Sweden.
Research Interests:
- Materials analysis using wide- and small-angle scattering
- In-situ measurements under thermal and mechanical loading
- Development of high-energy synchrotron techniques
Selected Publications:
- Y.Sun, Y. Ren, D. Haeffner, J. Almer, L. Wang, WG. Wang andTT. Truong, "Nanophase Evolution at Semiconductor/ Electrolyte Interface in Situ Probed by Time-Resolved High-Energy Synchrotron X-ray Diffraction", NanoLetters (2011), 10(9), 3747-3753.
- J. Almer, U. Lienert, R. L. Peng, C. Schlauer and M. Oden, "Strain and Texture Analysis of Coatings using High-Energy X-rays", Journal of Applied Physics (2003), 94 (1), 697-702.
- X.-L. Wang, J. Almer, C.T. Liu, Y.D. Wang, J.K. Zhao, A.D. Stoica and W.H. Wang, "In Situ Synchrotron Study of Phase Transformation Behaviors in Bulk Metallic Glass by Simultaneous Diffraction and Small Angle Scattering", Physical Review Letters (2003), 91 (26), 265501-1-4.
- Stock, S.R., J. Barss, T. Dahl, A. Vies, and J.D. Almer, "X-ray Absorption Microtomography (microCT) and Small Beam Diffraction Mapping of Sea Urchin Teeth", Journal of Structural Biology (2002), 139 (1), 1-12.
- J.D. Almer, J.B. Cohen, and R.A. Winholtz, "The Effects of Residual Macrostresses and Microstresses on Fatigue Crack Propagation", Metallurgical and Materials Transactions A (1998), 29A (8), 2127-36.
Last updated: May 16, 2011