4-ID-C - Sector 4
Soft X-ray Polarization Dependent Scattering and Spectroscopy


Overview
      4-ID-C is the soft x-ray (500 eV -> 3000 eV) branch of sector 4.   This branch has a unique helical undulator as a source  capable of providing both circular and linear polarization on the sample. 
 
Responsible Scientists
  • John Freeland, phone: (630) 252-9614, fax: (630) 252-7392, e-mail: freeland@aps.anl.gov 
  • David Keavney, phone: (630) 252-7893, fax: (630) 252-7392, e-mail: keavney@aps.anl.gov 
  • Richard Rosenberg , phone: (630) 252-6112, fax: (630) 252-7392, e-mail: rar@aps.anl.gov 
 
Scientific Interests
  • Magnetic spectroscopies using polarized light. 
  • Imaging and micro-spectroscopy with photoelectron microscopy (PEEM) . 

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Source Characteristics
APS Helical Undulator
Device Length 2.47 m
Undulator Period 12.8 cm
First Harmonic Range 0.5 to 3.0 keV
Total Power 800 Watts
 
Optical Components
Component Distance from Source Comment
Mirror (M1C) 29.5 m 1.1 deg. plane (Pt,Rh,Si)
Mirror (M2C) 30.6 m 1.1 deg. sphere, hor. focussing (Pt,Rh,Si)
Mirror (M3C) 41.4 m 1.00 deg. sphere, vert. focussing
Monochromator 50.0 m spherical grating
Experiment station 58.5 m UHV sample chamber
 
Beamline Configuration

The first optics enclosure (FOE, 4-ID-A) houses the optics used to seperate the C- and D- branch x-ray beams.
 
Beamline Control
The beamline is run by Sun workstations (UNIX/Solaris) and VME-based electronics. The VME-based equipment is controlled by EPICS. There are several software clients that use EPICS, including MEDM, Python, and SPEC. Other computers, such as PCs, are used to run specialized pieces of equipment (e.g., the CCD camera).
 
Experimental End Stations
  • X-ray magnetic dichroism chamber
  • X-ray photo-emission microscope (X-PEEM)
 
Ancillary Equipment
  • CCD camera;
  • High resolution flourescence detector
 
Milestones
Milestone Date Comment
First beam in 4-ID-C May, 2001  


Posted by: Becki Gagnon ( gagnon@aps.anl.gov)
Content by: John Freeland ( freeland@aps.anl.gov)