Advanced Photon Source User Activity Report

SRI-CAT, Synchrotron Radiation Instrumentation Collaborative Access Team

A high-energy phase retarder for the simultaneous production of right- and left-handed circularly polarized x-rays
C.T. Venkataraman, J.C. Lang, C.S. Nelson, G. Srajer, D.R. Haeffner, and S.D. Shastri

A new high-speed x-ray beam chopper
A. McPherson, J. Wang, P.L. Lee, and D.M. Mills

A wide-angle x-ray diffraction study of alkali tellurite glasses
J. McLaughlin, J. Zwanziger, S. Shastri, and D. Haeffner

Development of a quantitative measurement of a diesel spray core using synchrotron x-rays
C.F. Powell, Y. Yue, S. Gupta, A. McPherson, R. Poola, and J. Wang

High-resolution atomic pair distribution functions of Cax/2AlxSi1-xO2 glasses by high-energy x-ray diffraction
V. Petkov, I-K. Jeong, M. Gutmann, P.F. Peterson, S.J.L. Billinge, S.D. Shastri, and B. Himmel

Metrology of a mirror at the Advanced Photon Source:  comparison between optical and x-ray measurements
L. Assoufid, J. Lang, J. Wang, and G. Srajer

Observing a true liquid behavior on polymer thin film surfaces
J. Wang, R. Guico, and K.R. Shull

Performance of the 1-BM beamline optics
J.C. Lang, G. Srajer, J. Wang, and P.L. Lee

Plastic zone size measurement with synchrotron radiation
R.A. Winholtz, Y. Prawoto, D.R. Haeffner, and P.L. Lee

Rotating crystal beam chopper developed at SRI-CAT
W.-K. Lee and A. McPherson

The effect of monovalent ions on a Langmuir monolayer
J. Kmetko, A. Datta, P. Lee, and P. Dutta

X-radiation damage of polymer thin films
A.G. Richter, J. Wang, R. Guico, and K.R. Shull

A microfocused circularly polarized x-ray probe for energies between 5 and 10 keV
J. Pollmann, G. Srajer, J. Maser, J. Lang, C. Nelson, C. Venkataraman, and D. Haskel

Bent double-Laue crystal monochromator for high-enery x-rays (50-200 keV)
S. Shastri, A. Mashayekhi, K. Fezzaa, W. Lee, P. Fernandez, G. Tajiri, D. Ferguson, and P. Lee

Change from a bulk discontinuous phase transition in V2H to a continuous transition in a defective near-surface skin layer
J. Trenkler, H. Abe, S.C. Moss, P. Wochner, D.R. Haeffner, and J. Bai

Characterization of focusing properties of GaAs Bragg-Fresnel optics
Y. Li, G. Wong, E. Caine, E. Hu, C. Safinya, P. Fernandez, and D. Haeffner

CVD diamond-based position-sensitive photoconductive detector for high-flux x-rays
D. Shu, P.K. Job, J. Barraza, T. Cundiff, D.R. Haeffner, and T.M. Kuzay

Design, construction, and testing of a rarefied-gas ionization chamber
A.M. Pyzyna, A. McPherson, S.D. Shastri, and D.R. Haeffner

HEXRD measurements of strain in plasma-sprayed coatings
T. Gnäupel-Herold, H.J. Prask, and D.R. Haeffner

High-heat-load tests of a water-cooled diamond monochromator
P.B. Fernandez, W.-K. Lee, D.M. Mills, C.S. Rogers, G. Tajiri, L. Assoufid, T. Graber, and S. Krasnicki

High-resolution inverse-cauchois scanning analyzer for high-energy x-rays
S. Shastri and D. Haeffner

Interfacial structure and magnetism in Fe/Gd multilayers
C.S. Nelson, G. Srajer, J.C. Lang, J. Pollmann, C.T. Venkataraman, S.K. Sinha, J.S. Jiang, and S.D. Bader

Magnetic domain mapping in Fe/SmCo spring magnets
J. Pollmann, G. Srajer, J. Maser, J. Lang, D. Haskel, C. Nelson, J.S. Jiang, and S.D. Bader

Microfocusing of 50 keV undulator radiation with two stacked zone plates
S. Shastri, J. Maser, B. Lai, and J. Tys

Orbital and charge order in La0.89Sr0.11MnO3
P. Wochner, J. Trenkler, A. Vigliante, J. Lang, G. Srajer, A. Moudden, A. Revcolevschi, L. Pinsard, and A. De Leon

Performance limits of direct cryogenically cooled silicon monochromators
W.-K. Lee, P. Fernandez, and D.M. Mills

Polaron scattering in colossal magnetoresistive oxides
L. Vasiliu-Doloc, S. Sinha, O. Seeck, R. Osborn, S. Rosenkranz, J. Mesot, J. Mitchell, J.W. Lynn, G. Preosti, and A. Fedro

Progress of the APS high-heat-load x-ray beam position monitor development
D. Shu, Z. Xia, H. Ding, J. Barraza, T.M. Kuzay, D. Haeffner, and M. Ramanathan

Resonant x-ray scattering at the Se edge in ferroelectric liquid crystal materials
L. Matkin, H. Gleeson, R. Pindak, P. Mach, C. Huang, G. Srajer, and J. Pollmann

Temperature dependence of the XMCD signal at the RE L3 edge in REFe2
J.C. Lang, G. Srajer, C.S. Nelson, C.T. Venkataraman, A.I. Goldman, C. Detlefs, Z. Islam, B.N. Harmon, K.W. Dennis, and R.W. McCallum

Time-resolved studies of phase transformations using high-temperature powder diffraction
M.J. Kramer, L. Margulies, R.W. McCallum, D.K. Finnemore, A.I. Goldman, S. Kycia, P.L. Lee, and D.R. Haeffner

X-ray interferometry development at the Advanced Photon Source
K. Fezzaa and W.-K. Lee

X-ray welding of metal-matrix composites
R.A. Rosenberg, Q. Ma, W. Farrel, M. Keefe, and D.C. Mancini


Synchrotron-radiation-induced anisotropic wet etching of GaAs
Q. Ma, D.C. Mancini, and R.A. Rosenberg

Synchrotron-radiation-induced, selective-area deposition of gold on polyimide from solution
Q. Ma,  N. Moldovan, D.C. Mancini, and R.A. Rosenberg

X-ray reflectivity studies of confined fluids
O.H. Seeck, I.D. Kaendler, D. Shu, Hyunjung Kim, D.R. Lee, M. Tolan, and S.K. Sinha


A hard x-ray scanning microprobe for fluorescence imaging and microdiffraction at the Advanced Photon Source
Z. Cai, B. Lai, P. Ilinski, D. Legnini, J. Maser, W. Yun, and W. Rodrigues

Determining microfocused x-ray beam size by x-ray fluorescence correlation spectroscopy
J. Wang, P.V. Satyam, O.H. Seeck, Z. Cai, and S.K. Sinha

Investigating magnet anisotropy using x-ray magnetic linear dichroism
W.J. Antel Jr., I. Coulthard, A.P.J. Stampfl, and J.W. Freeland

Measuring absorption of buried layers utilizing substrate fluorescence as a detector
J.W. Freeland, I. Coulthard, R. Winarski, D. Ederer, J.S. Jiang, A. Inomata, S.D. Bader, and T.A. Calcott

Microdiffraction of DNA-membrane self-assemblies for gene delivery applications
G. Wong, Y. Li, I. Koltover, C. Safinya, Z. Cai, and W. Yun

Resonant Auger spectroscopy study of the Al/Al2O3 interface
I. Coulthard, W.J. Antel Jr., S.P. Frigo, J.W. Freeland, J. Moore, W.S. Calaway, M.J. Pellin, M. Mendelsohn, T.K. Sham, S.J. Naftel, and A.P.J. Stampfl

Synchrotron x-ray microdiffraction diagnostics of multilayer optoelectronic devices
Z. Cai, W. Rodrigues, P. Ilinski, D. Legnini, B. Lai, W. Yun, E.D. Isaacs, K.E. Lutterodt, J. Grenko, R. Glew, S. Sputz, J. Vandenberg, R. People, M.A. Alam, M. Hybertsen, and L.J.P. Ketelsen

The dependence of x-ray speckle contrast on focusing optics
C.C. Retsch, Y. Wang, S.P. Frigo, I. McNulty, L.B. Lurio, and G.B.Stephenson

X-ray excited optical luminescence studies of oxidized porous silicon
I. Coulthard, J.W. Freeland, W.J. Antel, Jr., T.K. Sham, S.J. Naftel, and P. Zhang

X-ray fluorescence correlation spectroscopy:  a method for studying particle dynamics in condensed matter
J. Wang, P.V. Satyam, Y. Feng, S.K. Sinha, Z. Cai, W. Yun, A.K. Sood, and X.-Z. Wu

X-ray fluorescence microtomography on a SiC nuclear fuel shell
M. Naghedolfeizi, J.-S. Chung, G.E. Ice, W.B. Yun, Z. Cai, and B. Lai

X-ray imaging and microscopy of plants and fungi
W. Yun, S.T. Pratt, R.M. Miller, Z. Cai, D.B. Hunter, A.G. Jarstfer, K.M. Kemner, B. Lai, H.-R. Lee, D.G. Legnini, W. Rodrigues, and C.I. Smith

A classical Hanbury Brown-Twiss experiment with hard x-rays
E. Gluskin, E.E. Alp, I. McNulty, W. Sturhahn, and J. Sutter

A high-resolution inelastic x-ray scattering spectrometer at the Advanced Photon Source
M. Schwoerer-Böhning, A.T. Macrander, D.A. Arms, and P.M. Abbamonte

An inelastic x-ray spectrometer with 2.3 meV energy resolution
H. Sinn, E.E. Alp, A. Alatas, J. Barraza, G. Bortel, E. Burkel, D. Shu, J. Sutter, and T. Toellner

Coherent resonant x-ray scattering from a roatating medium: the nuclear lighthouse effect
R. Röhlsberger, T.S. Toellner, W. Sturhahn, K. Quast, E.E. Alp, and E. Burkel

Data analysis for inelastic nuclear resonant absorption experiments
M. Hu, W. Sturhahn, T. Toellner, P . Hession, J. Sutter, and E. Alp

Design of a high-resolution high-stability positioning mechanism for crystal optics
D. Shu, T.S. Toellner, and E.E. Alp

Fe3Pt, an example for phonon softening at the structural phase transition
N. Wiele, H. Franz, T. Ansthalter, and W. Petry

High-resolution monochromators for nuclear resonant scattering of 119Sn
M. Hu, T. Toellner, W. Sturhahn, P. Lee, P. Hession, J. Sutter, and E. Alp

Inelastic nuclear resonant absorption of synchrotron radiation in thin terbium-iron films
T. Ruckert, W. Keune, W. Sturhahn, M.Y. Hu, J.P. Sutter, T.S. Toellner, E.E. Alp, and R. Roehlsberger

In-line high-resolution monochromator for 21.6 keV x-rays
T. Toellner, D. Shu, G. Bortel, and M. Hu

Lamb-Mössbauer factor and second -order Doppler shift of hematite
W. Sturhahn, E. Alp, K. Quast, and T. Toellner

Measurement of the valence electron form factor of beryllium using inelastic x-ray scattering
A. Alatas, H. Sinn, E.E. Alp, G. Bortel, and E. Burkel

Nuclear inelastic scattering of synchrotron radiation on metmyoglobin
K. Achterhold, C. Keppler, U. van Burck, W. Potzel, W. Sturhahn, E.E. Alp, and F. Parak

Optical design for laser Doppler angular encoder with subnanoradian sensitivity
D, Shu, E. Alp, J. Barraza, T. Kuzay, and T. Mooney

Phonon density of states in epitaxial Fe/Cr(001) superlattices
T. Ruckert, W. Keune, W. Sturhahn, M.Y. Hu, J.P. Sutter, T.S. Toellner, and E.E. Alp

Phonon dispersion of diamond measured by inelastic x-ray scattering
M. Schwoerer-Böhning, A.T. Macrander, and D.A. Arms 

Phonons in large-band-gap materials
M. Schwoerer-Böhning and A.T. Macrander

Phonons in wurtzite aluminum nitride
M. Schwoerer-Böhning, A.T. Macrander, M. Pabst, and P. Pavone

Powder Bragg backscattering spectroscopy
Y. Shvyd'ko, E. Gerdau, M. Lucht, E. Alp, and J. Sutter

Sub-meV monochromator development for 14.4 keV x-rays
T. Toellner, M. Hu, W. Sturhahn, J. Sutter, and E. Alp

Vibrational density of states of Fe thin films
R. Roehlsberger, W. Sturhahn, T. Toellner, K. Quast, P. Hession, M. Hu, J. Sutter, and E. Alp

Wavelength dispersive analyzer for inelastic x-ray scattering
G. Bortel, E.E. Alp, W. Sturhahn, and T.S. Toellner