1.1 Background
1.2 Mission of the Experimental Facilities Division
1.3 Mission of the User Program Division
1.4 XFD and UPD Organization
1.5 SRI CAT and R&D in Support of Users
1.6 APS Free-Electron Laser Developments
1.7 User Technical Support
1.8 Collaborative Work
1.9 Long-Term R&D Plans
2 SRI-CAT Beamlines, Technical Developments, and Scientific Applications
2.1 Mission of SRI CAT2.2 SRI-CAT Beamline Layout and General Description of Activities
2.3 X-ray Imaging and Microfocusing
2.3.1 A New Facility: the 2-ID-E X-ray Fluorescence Microprobe2.3.1.1 2-ID-E side-branch beamline
2.3.1.2 Optimized design
2.3.1.3 Performance2.3.2 A High-Throughput X-ray Microtomography System
2.3.2.1 System architecture
2.3.2.2 Data acquisition system
2.3.2.3 Control software
2.3.2.4 Performance
2.3.2.5 Local parallel processing2.3.3 Stacked Zone Plates
2.3.3.1 Near-field stacking of zone plates
2.3.3.2 Microfocusing with stacked zone plates2.3.4 Imaging and Microfocusing Applications
2.3.4.1 Biological and medical applications
2.3.4.2 Environmental and geosciences
2.3.4.3 Nuclear materials studies
2.3.4.4 Nanotomography of chips
2.3.4.5 Noninterferometric quantitative x-ray phase imaging
2.3.4.6 Interferometry2.4 Microfabrication and Deep X-ray Lithography
2.4.1 Novel X-ray Optical Elements
2.4.2 Zone Plate Fabrication by Focused Ion Beams2.5 High-Energy X-ray Scattering
2.5.1 A New Bent-Crystal High-Throughput Monochromator2.5.2 High-Energy Applications
2.5.2.1 Polaron studies
2.5.2.2 Confined fluids
2.5.2.3 High-temperature powder diffraction2.6 High-Resolution X-ray Scattering
2.6.1 Nuclear Resonant Scattering2.6.1.1 High-pressure applications
2.6.1.2 Biological materials and organic molecules: Dynamics of proteins
2.6.1.3 Thin films, multilayers, and amorphous materials2.6.2 Inelastic X-ray Scattering
2.6.2.1 A new spectrometer with 2 meV resolution for inelastic x-ray scattering
2.6.2.2 Inelastic x-ray measurements on liquid aluminum
2.6.2.3 Investigation of collective excitation in lithium-ammonia mixtures2.6.3 Fundamental Measurements
2.6.3.1 Normal incidence diffraction in Si and Al2O3
2.6.3.2 X-ray wavelength standard
2.6.3.3 Instrumentation development2.7.1 A Microfocused Circularly Polarized X-ray Probe for Energies between 5 and 10 keV
2.7.2 Temperature Dependence of the X-ray Magnetic Circular Dichroism Signal at the RE L3 Edge in REFe2
2.7.3 Interfacial Structure and Magnetism in Fe/Gd Multilayers
2.7.4 Exploring Magnetic Anisotrophy Using Polarized X-rays
2.7.5 Microspectroscopy and Imaging with Photoelectron Microscopy
2.7.6 X-ray-Excited Optical Luminescence Studies of Oxidized Porous Silicon
2.7.7 Changes of a Ferromagnet/Insulator Interface upon Thermal Annealing2.8 Time-Resolved X-ray Techniques Development
2.8.1 Fuel Spray Studies
2.8.2 Polymer Thin-Film Dynamics and X-ray Damage2.8.2.1 Polymer thin-film dynamics
2.8.2.2 X-ray damage in polymer thin films2.8.3 Time-Resolved X-ray Absorption Near-Edge Spectroscopy (XANES)
2.8.4 X-ray Beam Chopper Development at SRI CAT
3 User Technical Support
3.1 Insertion Devices3.1.1 Circularly Polarized Undulator
3.1.2 Fabrication of a New Gap Separation Mechanism for Insertion Devices
3.1.3 Insertion Device Vacuum Chamber Development and Fabrication3.1.3.1 BESSY insertion device vacuum chamber fabrication
3.1.3.2 DESY FEL vacuum chamber fabrication
3.1.3.3 SLS insertion device vacuum chamber design and fabrication3.2.1 Cryogenically Cooled Silicon Monochromators
3.2.2 Diamond High-Heat-Load Tests3.3 Synchrotron Radiation Instrumentation Engineering
3.3.1 Undulator-Only Front End
3.3.2 Double-Undulator Split Beamlines
3.3.3 Impact Studies on the Bending Magnet Front Ends for a 6-mm Lattice Offset
3.3.4 Beamline Components Development3.3.4.1 New XBPM development
3.3.4.2 Wide-angle monochromatic photon shutter
3.3.4.3 Technology developments for white-beam components
3.3.4.4 High-resolution and precision instrumentation3.4 X-ray Optics Fabrication and Metrology
3.4.1 X-ray Optics Metrology Laboratory3.4.1.1 Recent enhancements in the metrology cleanroom
3.4.1.2 Mirror metrology
3.4.1.3 Atomic force microscope3.4.2 International Workshop on Metrology for X-ray and Neutron Optics
3.4.3 Deposition Laboratory
3.4.3.1 Microfocusing mirrors
3.4.3.2 Graded multilayer deposition
3.4.3.3 Double-multilayer monochromator for beamline 2-BM
3.4.3.4 Reactive sputter deposition3.4.4 Fabrication Laboratories
3.4.5 X-ray Characterization Laboratory
3.5. Beamline Controls and Data Acquisition
3.5.1 Overview and General Remarks
3.5.2 Scan-Related Software
3.5.3 EPICS String-Sequence Record
3.5.4 EPICS Optical Table Record
3.5.5 Java Interface to EPICS Channel-Access Library
3.5.6 Conversion to EPICS Message Passing Facility
3.5.7 Merging Third-Party Software
3.5.8 CCD Image-Grabber Software
3.5.9 Insertion Device Support
3.5.10 Progress toward a Standard Scripting Language
3.5.11 Parameter Management Software
3.5.12 Motor Support
3.5.13 System/Network Administration
4.1 Plans for Future Instrumentation and Technique Development4.1.1 X-ray Imaging and Microscopy
4.1.2 High-Energy X-ray Scattering
4.1.3 High-Resolution X-ray Scattering
4.1.4 Polarization Techniques
4.1.5 Time-Resolved Program4.2 User Support
4.2.1 Synchrotron Radiation Instrumentation Engineering
4.2.2 Insertion Devices
4.2.3 Optics Fabrication and Metrology
4.2.4 High-Heat-Load Optics4.3 New Initiatives
4.3.1 Center for Nanoscale Materials
4.3.2 Inelastic X-ray Scattering (IXS) CAT
4.3.3 Normal Incidence Diffraction Beamline at Sector 1
4.3.4 High-Energy X-ray (HEX) CAT
Appendix 1: 1999 & 2000 XFD and UPD Publications