Workshop on Frontier Science Using Soft X-Rays at the APS
August 5-6, 2004, APS, Argonne, Illinois
Scope
The use of both linearly and circularly polarized soft x-rays in the energy range 400-2500 eV from a third generation synchrotron sources is now receiving serious attention world-wide. Some of the applications are well established and others are new, but the implementation of the capability at the APS is expected to advance research in condensed matter physics and material science. The use of soft x-rays for angle-resolved photoemission increases the inelastic mean free path of the electrons, rendering the technique more bulk sensitive. The ability to realize 10-15 meV resolution in this energy range will open possibilities to study materials such as oxide superconductors and highly correlated and complex (large unit cell) materials without regard to the surface condition. Use of circular polarization properties will allow us to probe microscopic magnetic behavior. Soft x-ray diffraction will make possible the study of structure with length scales of nanometers, such as orbital ordering in complex materials, stripping phenomena, etc. The biological applications are also numerous, such as the emerging technique of soft x-ray tomography, structural order at the mesoscale, protein dynamics, etc. The purpose of this workshop is to explore these emerging scientific opportunities, and to seek input from experts who seek to utilize such developments. The two-day workshop will have invited talks in these areas, with significant time allowed for discussions after each topic, during which brief (2-3 slides) contributions are welcome.
