Hands-On Short Course in EXAFS Data Collection and Analysis

Brookhaven National Laboratory, NY
July 14-17, 2003

Bruce Ravel (ravel@phys.washington.edu) or
Simon Bare (simon.bare@uop.com)

A hands-on short course in EXAFS data collection and analysis will be held at the NSLS from July 14-17. This workshop will provide a broad introduction to the collection and analysis of EXAFS data and is aimed at new synchrotron users and young scientists. The four-day course includes classroom lectures given by leading experts, hands-on data collection at NSLS beamlines, and instruction in the use of data analysis software. The lectures will cover topics ranging from the basic physics of x-ray absorption, sample preparation and data collection, and basic principles of data analysis. Participants will collect real data during the beamline practicals and learn to analyze that data during the computer training. The deadline to register for the course is June 2, 2003.