[Xrays@aps.anl.gov] 2006 XSD Scientific Software Workshop User Survey
Brian H. Toby
Brian.Toby at ANL.gov
Fri Jun 23 10:21:48 CDT 2006
> 1. What are the limitations of current tools for
> x-ray data reduction, analysis, modeling, and simulation?
Powder diffraction (Rietveld) software is quite well developed and
sophisticated, but it has been written with experts as intended
users, so it tends not to do much input validation and does not do
much "hand holding". It has not been well integrated into data
collection on user instruments, so we frequently see the question
"how do I convert data from instrument X to format Y."
> 2. What additional tools are needed?
The ability to fit models against multiple techniques (EXAFS, NMR,
Electron microscopy, quantum,...).
>
> 3. How can the existing tools be improved?
>
The programs themselves are monolithic and this limits science. We
now want modular software so that analysis can be knit together as
needed by the experiment. Further, existing codes are written in
Fortran-77, which is very hard now to maintain or expand. It is time
to think about starting a new analysis package from the ground up.
> 4. What will most affect the scientific impact of your work?
Impacts should be very significant. New codes that designed to be
used by non-experts will open the technique up to a very wide range
of users. Ability to work on problems where diffraction data alone
are inconclusive, but where other physical characterization data can
be modeled will allow for much new science to be done on very
complex, on poorly ordered or small crystallites problems that are
frequently intractable now.
Brian
********************************************************************
Brian H. Toby, Ph.D. office: 630-252-5488
Materials Characterization Group Leader, Advanced Photon Source
9700 S. Cass Ave, Bldg. 433/D003 work cell: 630-327-8426
Argonne National Laboratory secretary (Kristy): 630-252-5453
Argonne, IL 60439-4856 e-mail: brian dot toby at anl dot gov
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