[Xrays@aps.anl.gov] Fwd: re: 2006 XSD Scientific Software Workshop User Survey

[Paul Zschack]

Pete:

Thanks for the opportunity for input.

Generally, it seems to me that area detectors which handle crystallographic 
data will become much more widely used.  Not only the large CCD detectors, 
but smaller devices that mount to a goniometer, and will need to be 
integrated both for ease of use and data analysis.  So, I suspect one of 
the more significant impacts one could have on data reduction/analysis 
would address and anticipate these needs.

The wide variety of commercially available data analysis software tools is 
a major problem.  Too many different users have their way of doing things 
and this diversity is a distraction.  If APS would select a single product 
platform and offer support for common tasks, and distribute common 
routines, this would become the platform to which all would eventually 
migrate (at least to some extent).  But I see you've already recognized this.

In the area of general purpose and surface/interface scattering, the 
experimental needs are quite diverse.  So, tools that allow easy access to 
and visualization of multi-dimensional (MCAs, areas or volumes) data in 
reciprocal space are important.  This is generally not image data, so 
additional processing and reduction is required.  For a user to know that 
the data collected is correct, the routines for visualization and 
comparison with modeling data are also essential.

Successful integration of data collection, extraction, and comparison to 
models in a straightforward approach that doesn't require specific 
expertise would make a significant impact to the productivity in our area.

With regards,
Paul




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>Date: Tue, 20 Jun 2006 07:20:45 -0500
>From: "Pete R. Jemian" <prjemian at ameritech.net>
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>To: undisclosed-recipients: ;
>Subject: re: 2006 XSD Scientific Software Workshop User Survey
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>
>
>
>Dear Colleague:
>
>Please note that the date for responses to the
>user survey is Thursday, June 22.
>
>Regards,
>  2006 XSD Scientific Software Workshop Organizing Committee
>
>
>------------------% clip %--------------------------
>
>June 13, 2006
>
>Dear Colleague,
>
>We have been asked by the XSD Division to organize a workshop to
>determine our fundamental needs and opportunities in scientific
>software systems for x-ray data reduction, analysis, modeling and
>simulation.  The workshop has been scheduled for August 29, 2006
>at the Advanced Photon Source.
>
>In order to prepare for this workshop we would like your input on
>what you see as the needs and opportunities for scientific
>software development at the APS and in the X-ray community, as
>well as information that would support making a funding proposal
>for such resources.  In particular:
>
>1. What are the limitations of current tools for
>   x-ray data reduction, analysis, modeling, and simulation?
>
>2. What additional tools are needed?
>
>3. How can the existing tools be improved?
>
>4. What will most affect the scientific impact of your work?
>
>
>We realize you have a busy schedule and appreciate your taking
>time to address these issues.  We need the responses by
>Thursday, June 22. Please direct your responses to:
>
>    xrays at aps.anl.gov
>
>
>Thank you,
>
>  2006 XSD Scientific Software Workshop Organizing Committee
>       Kenneth Evans, Jr. <evans at aps.anl.gov>
>       Francesco De Carlo <decarlo at aps.anl.gov>
>       Pete Jemian <jemian at anl.gov>
>       Jonathan Lang <lang at aps.anl.gov>
>       Ulrich Lienert <lienert at aps.anl.gov>
>       John Maclean <jfm at aps.anl.gov>
>       Matt Newville <newville at cars.uchicago.edu>
>       Brian James Tieman <tieman at aps.anl.gov>
>       Brian H. Toby <toby at anl.gov>
>       Michel A. Van Veenendaal <michel at aps.anl.gov>
>
>_______________________________________________
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>Xrays at mailman.aps.anl.gov
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Paul Zschack
Advanced Photon Source
Argonne National Lab
Argonne, IL  60439
(630) 252-0860