[Xrays@aps.anl.gov] 2006 XSD Scientific Software Workshop User Survey

[Wenjun Liu]

Dear Dr. Xrays @aps.anl.gov,

Glad to know that there will be an XSD scientific software Workshop soon.
Here are some of my thoughts on improving data processing capability
for analyzing large sets of synchrotron three-dimensional imaging data
at 34-ID-E microdiffraction beamline.

The major research activities in the beamline 34-ID-E involve development of
new micro/nano-diffraction techniques for characterization and microscopy
for condensed matter physics and material sciences. Three-dimensional
micro-diffraction provides structural information of materials with better
than 1 micron spatial resolution in all three dimensions enabling detailed
studies of fundamental deformation processes, basic grain-growth behavior,
and small scale structures.

The unique capabilities of 3D micro-diffraction probe will continue to be
improved to meet user demands, including enhanced capabilities of fast data
collection and process and more user-friendly analyzing software improvement.

1. Enhanced capabilities of fast data collection and process:

Current commercially available CCD detectors appropriate for 3D 
micro-diffraction
needs collect data at speed of >10MB/sec. To process the image data at these
rates and enable real time in-situ measurements requires enhanced computing
capability. A cluster computer with high-speed network connections will be a
solution. To take the advantage of parallel computing on cluster, supporting
software development and integration into existing analyzing software are
essential.

2. User-friendly analyzing software improvement:

The current 3D micro-diffraction analyzing software package was developed by
Oak Ridge National Lab using IDL language. ORNL, as partner user of 
the beamline
working together with APS beamline staff, will continue developing 
the existing
software to make it more user friendly and efficient for fast data processing.
Recent plan includes modification of existing modules and possible redesign
of the software architecture to meet parallel computing needs.

We believe that all these will continue the excellent scientific research and
development and provide dramatically increased user throughput not for 34-ID-E
beamline only, but also for the growing community of 3-D x-ray microdiffraction
world wide.

Thanks,

Wenjun

========================================
Wenjun Liu, Ph. D.
Beamline Scientist
Building 438D
Advanced Photon Source
Argonne National Laboratory
9700 South Cass Avenue
Argonne, IL 60439
E-mail: wjliu at anl.gov
Tel:(630)252-0890 (office)
     (630)252-1834 (beamline)
Fax:(630)252-0862
http://www.uni.aps.anl.gov/microdiff/
========================================

At 07:20 AM 6/20/2006, you wrote:

>Dear Colleague:
>
>Please note that the date for responses to the
>user survey is Thursday, June 22.
>
>Regards,
>  2006 XSD Scientific Software Workshop Organizing Committee
>
>
>------------------% clip %--------------------------
>
>June 13, 2006
>
>Dear Colleague,
>
>We have been asked by the XSD Division to organize a workshop to
>determine our fundamental needs and opportunities in scientific
>software systems for x-ray data reduction, analysis, modeling and
>simulation.  The workshop has been scheduled for August 29, 2006
>at the Advanced Photon Source.
>
>In order to prepare for this workshop we would like your input on
>what you see as the needs and opportunities for scientific
>software development at the APS and in the X-ray community, as
>well as information that would support making a funding proposal
>for such resources.  In particular:
>
>1. What are the limitations of current tools for
>   x-ray data reduction, analysis, modeling, and simulation?
>
>2. What additional tools are needed?
>
>3. How can the existing tools be improved?
>
>4. What will most affect the scientific impact of your work?
>
>
>We realize you have a busy schedule and appreciate your taking
>time to address these issues.  We need the responses by
>Thursday, June 22. Please direct your responses to:
>
>    xrays at aps.anl.gov
>
>
>Thank you,
>
>  2006 XSD Scientific Software Workshop Organizing Committee
>       Kenneth Evans, Jr. <evans at aps.anl.gov>
>       Francesco De Carlo <decarlo at aps.anl.gov>
>       Pete Jemian <jemian at anl.gov>
>       Jonathan Lang <lang at aps.anl.gov>
>       Ulrich Lienert <lienert at aps.anl.gov>
>       John Maclean <jfm at aps.anl.gov>
>       Matt Newville <newville at cars.uchicago.edu>
>       Brian James Tieman <tieman at aps.anl.gov>
>       Brian H. Toby <toby at anl.gov>
>       Michel A. Van Veenendaal <michel at aps.anl.gov>
>
>_______________________________________________
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>Xrays at mailman.aps.anl.gov
>http://www.aps.anl.gov/mailman/listinfo/xrays